Toshiba TECRA S1 ユーザーズマニュアル

Extended Memory Start Address and Extended Memory End 
Address (MB): Set the range of extended memory that is to be tested. 
The test coverage will base on the value setting in ‘Percent (%)’ 
mentioned at below. 

Percent (%): Choose the percentage of the defined range of the 
memory to be tested. 

1.  Write/Read Cycle Test 

Test by using both read and write instructions. 

2.  Read Cycle Test 

Test by using read instructions. 

The test item is to make sure that there is no short circuitry issue in memory chip. 

The parameter dialog window is the same as that in ‘Subtest 02 Pattern’. 

The test item is to make sure that there is no open circuitry issue in memory chip. 

The parameter dialog window is the same as that in ‘Subtest 02 Pattern’. 

This test item is to check short and open issue on memory address lines. 

This test item is to check whether the memory refresh works normally. The 

parameter dialog window is as follows: