Nokia 6585 サービスマニュアル

CCS Technical Documentation

Troubleshooting - RF (Part 1)

RH-34

Issue 1 11/2003     Confidential         ©

2003 Nokia Corporation

Page 25

RF MS RX FER PCS CH600

At this stage, FER is most likely caused by a poor RF 
connection. Perform a conductive RSSI measurement 
with sector power at -65dBm (low LNA gain) and -
100dBm (high LNA gain).

RF MS RX FER CELL CH384

At this stage, FER is most likely caused by a poor RF 
connection. Perform a conductive RSSI measurement 
with sector power at -65dBm (low LNA gain) and -
100dBm (high LNA gain).

RF MS SINAD

SINAD is measurement of a phone’s audio quality in an 
AMPS call. Hence, a secured audio plug is needed to be 
checked for any connection problem. Verify this on the 
bench in an AMPS call.

RF GPS Test Mode 3

Inject signal and test SNR with the GPS self-test. If 
SNR is out-of-limits, then probe chain.

RF MS TX Limiting Po PCS CH25

Tx limiting power is most likely caused by a poor RF 
connection.

RF MS TX Limiting Po CELL CH1013

Tx limiting power is most likely caused by a poor RF 
connection.