Analog Devices AD5520 Evaluation Board EVAL-AD5520EBZ EVAL-AD5520EBZ データシート
製品コード
EVAL-AD5520EBZ
Per Pin Parametric
Measurement Unit/Source Measure Unit
AD5520
Rev. B
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rights of third parties that may result from its use. Specifications subject to change without notice.
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responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice.
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Devices. Trademarks and registered trademarks are the property of their respective owners.
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© 2005 Analog Devices, Inc. All rights reserved.
FEATURES
Force/measure functions
FIMV, FVMI, FVMV, FIMI, FNMV
Force/measure voltage range ±11 V
4 user programmable force/measure current ranges
4 user programmable force/measure current ranges
±4 μA, ±40 μA, ±400 μA, ±4 mA (external resistors)
2 user programmable extended current ranges
Up to 6 mA without external driver
Higher currents with external driver
Higher currents with external driver
Clamp circuitry and window comparators on board
Guard amplifier
64-lead LQFP package
Guard amplifier
64-lead LQFP package
APPLICATIONS
Automatic test equipment
Per pin PMU, shared pin PMU, device power supply
instrumentation
Source measure, parametric measurement,
precision measurement
GENERAL DESCRIPTION
The AD5520 is a single-channel, per pin parametric measure-
ment unit (PPMU) for use in semiconductor automatic
test equipment. The part is also suited for use as a source
measurement unit for instrumentation applications. It
contains programmable modes to force a pin voltage and
measure the corresponding current, or force a current and
measure the voltage. The AD5520 can force/measure over a
±11 V range or user-programmable currents up to ±4 mA
with its on-board force amplifier. An external amplifier is
required for wider current ranges. The device provides a force
sense capability to ensure accuracy at the tester pin. A guard
output is also available to drive the shield of a force/sense pair.
The AD5520 is available in a 64-lead LQFP package.
ment unit (PPMU) for use in semiconductor automatic
test equipment. The part is also suited for use as a source
measurement unit for instrumentation applications. It
contains programmable modes to force a pin voltage and
measure the corresponding current, or force a current and
measure the voltage. The AD5520 can force/measure over a
±11 V range or user-programmable currents up to ±4 mA
with its on-board force amplifier. An external amplifier is
required for wider current ranges. The device provides a force
sense capability to ensure accuracy at the tester pin. A guard
output is also available to drive the shield of a force/sense pair.
The AD5520 is available in a 64-lead LQFP package.
FUNCTIONAL BLOCK DIAGRAM
CL
L
D
ET
ECT
MEASI4H
FIN
BW SELECT
COM
P
OUT2
FOH1
FOH2
FOH3
FOH0
AV
EE
AV
CC
CLH
CLL
REFGND
MEASIOUT
MEASOUT
MEASVOUT
G = 16
G = 1
CPH
CPOH
CPOL
CPL
MEASI5H
MEASIL
GUARDIN
GUARD
MEASVH
MEASVL
AGND
QM5
QM4
DGND
DV
DD
CS
STANDBY
COM
P
OUT1
COM
P
OUT0
COM
P
IN
2
COM
P
IN
1
COM
P
IN
0
CLAMP
DETECT
I
SENSE
INST AMP
V
SENSE
INST AMP
LOGICS
AC0
AC1
CLHDETECT
MOE
AM
0
AM
1
AM
2
M
SEL
F
SEL
CPSEL
ST
B
CPCK
AD5520
COMPARATOR
G = 1
FOH
MEASI3H
MEASI2H
MEASI1H
MEASI0H
03701-001
Figure 1.