Intel 1020E AV8063801276200 ユーザーズマニュアル

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AV8063801276200
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Signal Description 
70
Datasheet, Volume 1
6.6
Direct Media Interface (DMI) Signals
6.7
Phase Lock Loop (PLL) Signals
6.8
Test Access Points (TAP) Signals
Table 6-8.
Direct Media Interface (DMI) Signals – Processor to PCH Serial Interface 
Signal Name
Description 
Direction/
Buffer Type
DMI_RX[3:0]
DMI_RX#[3:0]
DMI Input from PCH: Direct Media Interface receive 
differential pair.
I
DMI
DMI_TX[3:0]
DMI_TX#[3:0]
DMI Output to PCH: Direct Media Interface transmit 
differential pair.
O
DMI
Table 6-9.
Phase Lock Loop (PLL) Signals 
Signal Name
Description 
Direction/
Buffer Type
BCLK
BCLK#
Differential bus clock input to the processor
I
Diff Clk
Table 6-10. Test Access Points (TAP) Signals 
Signal Name
Description 
Direction/
Buffer Type
BPM#[7:0]
Breakpoint and Performance Monitor Signals: These signals 
are outputs from the processor that indicate the status of 
breakpoints and programmable counters used for monitoring 
processor performance.
I/O
CMOS
BCLK_ITP 
BCLK_ITP#
These signals are connected in parallel to the top side debug 
probe to enable debug capacities. 
I
DBR#
DBR# is used only in systems where no debug port is 
implemented on the system board. DBR# is used by a debug 
port interposer so that an in-target probe can drive system 
reset.
O
PRDY#
PRDY# is a processor output used by debug tools to determine 
processor debug readiness.
O
Asynchronous 
CMOS
PREQ#
PREQ# is used by debug tools to request debug operation of the 
processor.
I
Asynchronous 
CMOS
TCK
Test Clock: This signal provides the clock input for the 
processor Test Bus (also known as the Test Access Port). TCK 
must be driven low or allowed to float during power on Reset.
I
CMOS
TDI
Test Data In: This signal transfers serial test data into the 
processor. TDI provides the serial input needed for JTAG 
specification support.
I
CMOS
TDO
Test Data Out: This signal transfers serial test data out of the 
processor. TDO provides the serial output needed for JTAG 
specification support.
O
Open Drain
TMS
Test Mode Select: A JTAG specification support signal used by 
debug tools.
I
CMOS
TRST#
Test Reset: This signal resets the Test Access Port (TAP) logic. 
TRST# must be driven low during power on Reset. 
I
CMOS