Viking Technology Technology Computer Drive PSF1XXXXGXXXX ユーザーズマニュアル
Manual
1/2/2014
PSFS1XXXXGXXXX
Viking Technology
Revision B7
Page 21 of 60
www.vikingtechnology.com
2.5.2 Shock and Vibration
Table 2-10: Shock and Vibration Specifications
Mode
Shock
1
Operating and non-
Operating
MIL STD-810F, section
516.5
516.5
50g 11ms, 3 Axis, Half Sine,
Positive and Negative
Positive and Negative
Vibration
1
Operating and non-
Operating
MIL STD-810F, section
514.5
514.5
10~1000Hz: 0.04g
2
/Hz 3 Axis
1000~2000Hz: 6db/oct 3 Axis
Notes:
1. Shock and vibration specifications assume that the SSD is latched securely. Stimulus may be applied in
1. Shock and vibration specifications assume that the SSD is latched securely. Stimulus may be applied in
the X, Y, or Z axis.
2.5.3 Electromagnetic Compatibility
Electromagnetic Compatibility tests assume the SSD is properly installed in the
representative host system. The drive will operate properly without errors or
degradation in performance when subjected to environments defined in the
following table:
representative host system. The drive will operate properly without errors or
degradation in performance when subjected to environments defined in the
following table:
Table 2-11: Electromagnetic Compatibility Specifications
Test
Description
Performance Criteria
Reference Standard
Electrostatic
discharge
discharge
Contact, HCP, VCP:
±8 kV; Air: ±15 kV
B
EN 61000-4-2: 1995
Radiated RF Immunity
80 to 6,000 MHz, 3
V/m, 80% AM with 1
kHz sine
A
EN 61000-4-3: 2002
ENV 50204: 1995
Surge Immunity
±1 kV differential, ±2
kV common, AC
mains
B
EN 61000-4-5: 1995
Conducted RF
Immunity
Immunity
150 kHz to 80 MHz, 3
Vrms, 80% AM with 1
kHz sine
A
EN 61000-4-6: 1996
Notes:
1. Performance Criteria A of CE Spec = The device shall continue to operate as intended, i.e.,
1. Performance Criteria A of CE Spec = The device shall continue to operate as intended, i.e.,
normal unit operation with no degradation of performance.
2. Performance Criteria B of CE Spec = The device shall continue to operate as intended after
completion of the test. However, during the test, some function degradation of performance is
allowed as long as there is no data loss operator intervention to restore device function.
allowed as long as there is no data loss operator intervention to restore device function.
3. Electrostatic discharge applied to drive enclosure.