Hitachi Microscope & Magnifier S-3400N ユーザーズマニュアル
3.9 Other Functions
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Fig. 3.9-14 LINE PROFILE SIGNAL Window
The Run/Freeze button changes run and stop alternately.
In the Freeze state, the line profile of an image is displayed clearly.
Recommended procedure for taking a photograph is:
In the Freeze state, the line profile of an image is displayed clearly.
Recommended procedure for taking a photograph is:
1) Observe an image in Position Set mode at Slow2 or slower scanning speeds.
Click the Line Analysis button when the scanning raster reaches the bottom of the
screen.
screen.
2) Set the line cursor at an analyzing position. Adjust the baseline (in case of SE or
BSE, adjust brightness) and the height (in case of SE or BSE, adjust contrast and in
case of X-ray, adjust the count-rate meter range) of the profile. Then stop the
scanning.
case of X-ray, adjust the count-rate meter range) of the profile. Then stop the
scanning.
The signal for line profile can be selected independent of the signal for image.
For example, you can observe or take a image of an X-ray intensity line profile on the
secondary electron image. To select a signal for the line profile, use the LINE
PROFILE SIGNAL block on the Setup dialog window - Image tab.
Saving an image under a Line Profile condition Freeze state causes an image
containing a profile to be saved. Line profiles cannot be photographed.
For example, you can observe or take a image of an X-ray intensity line profile on the
secondary electron image. To select a signal for the line profile, use the LINE
PROFILE SIGNAL block on the Setup dialog window - Image tab.
Saving an image under a Line Profile condition Freeze state causes an image
containing a profile to be saved. Line profiles cannot be photographed.
(3) Spot Analysis mode
Stops the scanning and places the electron beam at a specified point on the image.
This is used for X-ray analysis of a point on the specimen.
The Spot Analysis button is used for two scanning modes as follows.
This is used for X-ray analysis of a point on the specimen.
The Spot Analysis button is used for two scanning modes as follows.
(a) Position Set mode for Spot Analysis
Upon the first click of the button in other scanning modes or in Spot Analysis mode, a
cross-hair cursor is overlaid on the image. The cross point of the cursor corresponds
to a position where the electron beam is positioned in Spot Analysis mode.
To select a position of the cursor, locate the mouse icon near the cross point.
When the mouse cursor is changed to an intersecting arrow mark
cross-hair cursor is overlaid on the image. The cross point of the cursor corresponds
to a position where the electron beam is positioned in Spot Analysis mode.
To select a position of the cursor, locate the mouse icon near the cross point.
When the mouse cursor is changed to an intersecting arrow mark
, drag the cursor
with the mouse while holding down the left button.