Samsung 1GB 400MHz DDR M368L2923DUN-CCC 전단

b. Pulldown slew rate is measured under the test conditions shown in Figure 3.

Output

Test point

VDDQ

50

Ω

Figure 3 : Pulldown slew rate test load

c. Pullup slew rate is measured between (VDDQ/2 - 320 mV +/- 250 mV)
    Pulldown slew rate is measured between (VDDQ/2 + 320 mV +/- 250 mV) 
    Pullup and Pulldown slew rate conditions are to be met for any pattern of data, including all outputs switching and only one output switching.
    Example : For typical slew rate, DQ0 is switching

      

 

For minmum slew rate, all DQ bits are switching from either high to low, or low to high. 

         

The remaining DQ bits remain the same as for previous state.

d. Evaluation conditions
    Typical    : 25 

°C (T Ambient), VDDQ = 2.5V(for DDR266/333) and 2.6V(for DDR400), typical process

    Minimum : 70 

°C (T Ambient), VDDQ = 2.3V(for DDR266/333) and 2.5V(for DDR400), slow - slow process

    Maximum :  0 

°C (T Ambient), VDDQ = 2.7V(for DDR266/333) and 2.7V(for DDR400), fast - fast process

e. The ratio of pullup slew rate to pulldown slew rate is specified for the same temperature and voltage, over the entire temperature and voltage range. 

For a given output, it represents the maximum difference between pullup and pulldown drivers due to process variation.

f. Verified under typical conditions for qualification purposes.

g. TSOPII package divices only.

h. Only intended for operation up to 266 Mbps per pin.

i. A derating factor will be used to increase tIS and tIH in the case where the input slew rate is below 0.5V/ns as shown in Table 2. The Input slew rate is 

based on the lesser of the slew rates detemined by either VIH(AC) to VIL(AC) or  VIH(DC) to VIL(DC), similarly for rising transitions.

j. A derating factor will be used to increase tDS and tDH in the case where DQ, DM, and DQS slew rates differ, as shown in Tables 3 & 4.  Input slew rate 

is based on the larger of AC-AC delta rise, fall rate and DC-DC delta rise,  Input slew rate is based on the lesser of the slew rates determined by either 
VIH(AC) to  VIL(AC) or VIH(DC) to VIL(DC), similarly for rising transitions. The delta rise/fall rate is calculated as:   {1/(Slew Rate1)} - {1/(Slew Rate2)}

  For example : If Slew Rate 1 is 0.5 V/ns and slew Rate 2 is 0.4 V/ns, then the delta rise, fall rate is - 0.5ns/V . Using the table given, this   
  would result in the need for an increase in tDS and tDH of 100 ps.

k. Table 3 is used to increase tDS and tDH in the case where the I/O slew rate is below 0.5 V/ns. The I/O slew rate is based on the lesser  on the lesser of 

the AC - AC slew rate and the DC- DC slew rate. The inut slew rate is based on the lesser of the slew rates deter mined by either VIH(ac) to VIL(ac) or 
VIH(DC) to VIL(DC),  and similarly for rising transitions.

m. DQS, DM, and DQ input slew rate is specified to prevent double clocking of data and preserve setup and hold times. Signal transi  tions through the 

DC region must be monotonic.

a. Pullup slew rate is characteristized under the test conditions as shown in Figure 2.

Output

Test point

VSSQ

50

Ω

Figure 2 : Pullup slew rate test load