Texas Instruments BQ27505EVM - BQ27505 System-Side, Single-Cell Impedance Track??? Technology Evaluation Module BQ27505E BQ27505EVM 데이터 시트
제품 코드
BQ27505EVM
Not Recommended for New Designs
www.ti.com
SLUS884 – FEBRUARY 2009
3.8
ADC (TEMPERATURE AND CELL MEASUREMENT) CHARACTERISTICS
T
A
= –40°C to 85°C, 2.4 V < V
CC
< 2.6 V; typical values at T
A
= 25°C and V
CC
= 2.5 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
V
IN(ADC)
Input voltage range
–0.2
1
V
t
ADC_CONV
Conversion time
125
ms
Resolution
14
15
bits
V
OS(ADC)
Input offset
1
mV
Z
ADC1
Effective input resistance (TS)
(1)
8
M
Ω
bq27505 not measuring cell voltage
8
M
Ω
Z
ADC2
Effective input resistance (BAT)
(1)
bq27505 measuring cell voltage
100
k
Ω
I
lkg(ADC)
Input leakage current
(1)
0.3
m
A
(1)
Specified by design. Not tested in production.
3.9
DATA FLASH MEMORY CHARACTERISTICS
T
A
= –40°C to 85°C, 2.4 V < V
CC
< 2.6 V; typical values at T
A
= 25°C and V
CC
= 2.5 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
t
DR
Data retention
(1)
10
Years
Flash-programming write cycles
(1)
20,000
Cycles
t
WORDPROG
Word programming time
(1)
2
ms
I
CCPROG
Flash-write supply current
(1)
5
10
mA
t
DFERASE
Data flash master erase time
(1)
200
ms
t
IFERASE
Instruction flash master erase time
(1)
200
ms
t
PGERASE
Flash page erase time
(1)
20
ms
(1)
Specified by design. Not production tested
Copyright © 2009, Texas Instruments Incorporated
ELECTRICAL SPECIFICATIONS
7
Product Folder Link(s):