Texas Instruments THS7364 Evaluation Module THS7364EVM THS7364EVM 데이터 시트
제품 코드
THS7364EVM
SBOS530 – AUGUST 2010
www.ti.com
ELECTRICAL CHARACTERISTICS: V
S+
= +5 V
At T
A
= +25°C, R
L
= 150
Ω
to GND, Filter mode, and dc-coupled input/output, unless otherwise noted.
THS7364
TEST
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNITS
LEVEL
(1)
AC PERFORMANCE (SD CHANNELS)
Passband bandwidth
–1 dB; V
O
= 0.2 V
PP
and 2 V
PP
6.6
8.2
10.2
MHz
B
Small- and large-signal bandwidth
–3 dB; V
O
= 0.2 V
PP
and 2 V
PP
8
9.5
11.3
MHz
B
Bypass mode bandwidth
–3 dB; V
O
= 0.2 V
PP
85
150
MHz
B
Slew rate
Bypass mode; V
O
= 2 V
PP
70
100
V/
m
s
B
With respect to 500 kHz, f = 6.75 MHz
–0.9
0.25
1.2
dB
A
Attenuation
With respect to 500 kHz, f = 27 MHz
42
54
dB
A
Group delay
f = 100 kHz
78
ns
C
Group delay variation
f = 5.1 MHz with respect to 100 kHz
11
ns
C
Channel-to-channel delay
0.3
ns
C
Differential gain
NTSC/PAL
0.25/0.35
%
C
Differential phase
NTSC/PAL
0.4/0.5
Degrees
C
Total harmonic distortion
f = 1 MHz, V
O
= 1.4 V
PP
–71
dB
C
100 kHz to 6 MHz, non-weighted
70
dB
C
Signal-to-noise ratio
100 kHz to 6 MHz, unified weighting
78
dB
C
All channels, T
A
= +25°C
5.7
6
6.3
dB
A
Gain
All channels, T
A
= –40°C to +85°C
5.65
6.35
dB
B
f = 6.75 MHz, Filter mode
0.9
Ω
C
Output impedance
f = 6.75 MHz, Bypass mode
0.9
Ω
C
Disabled
20 || 3
k
Ω
|| pF
C
Return loss
f = 6.75 MHz, Filter mode
44
dB
C
Crosstalk
f = 1 MHz, SD to SD channels
–72
dB
C
(1)
Test levels: (A) 100% tested at +25°C. Over temperature limits set by characterization and simulation. (B) Limits set by characterization
and simulation only. (C) Typical value only for information.
and simulation only. (C) Typical value only for information.
6
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