Texas Instruments LM4562 Evaluation Board LM4562NABD LM4562NABD 데이터 시트
제품 코드
LM4562NABD
SNAS326K – AUGUST 2006 – REVISED DECEMBER 2013
ELECTRICAL CHARACTERISTICS FOR THE LM4562
(1) (2)
The specifications apply for V
S
= ±15V, R
L
= 2k
Ω, f
IN
= 1kHz, T
A
= 25°C, unless otherwise specified.
LM4562
Units
Symbol
Parameter
Conditions
(Limits)
Typical
(3)
Limit
(4)
A
V
= 1, V
OUT
= 3V
rms
THD+N
Total Harmonic Distortion + Noise
R
L
= 2k
Ω
0.00003
% (max)
R
L
= 600
Ω
0.00003
0.00009
A
V
= 1, V
OUT
= 3V
RMS
IMD
Intermodulation Distortion
0.00005
%
Two-tone, 60Hz & 7kHz 4:1
GBWP
Gain Bandwidth Product
55
45
MHz (min)
SR
Slew Rate
±20
±15
V/
μs (min)
V
OUT
= 1V
P-P
, –3dB
FPBW
Full Power Bandwidth
referenced to output magnitude
10
MHz
at f = 1kHz
A
V
= –1, 10V step, C
L
= 100pF
t
s
Settling time
1.2
μs
0.1% error range
Equivalent Input Noise Voltage
f
BW
= 20Hz to 20kHz
0.34
0.65
μV
RMS
(max)
e
n
f = 1kHz
2.7
4.7
nV/
√Hz
Equivalent Input Noise Density
f = 10Hz
6.4
(max)
i
n
f = 1kHz
1.6
Current Noise Density
pA/
√Hz
f = 10Hz
3.1
V
OS
Offset Voltage
±0.1
±0.7
mV (max)
Average Input Offset Voltage Drift vs
ΔV
OS
/
ΔTemp
–40°C
≤ T
A
≤ 85°C
0.2
μV/°C
Temperature
Average Input Offset Voltage Shift vs
PSRR
ΔV
S
= 20V
(5)
120
110
dB (min)
Power Supply Voltage
f
IN
= 1kHz
118
ISO
CH-CH
Channel-to-Channel Isolation
dB
f
IN
= 20kHz
112
I
B
Input Bias Current
V
CM
= 0V
10
72
nA (max)
Input Bias Current Drift vs
ΔI
OS
/
ΔTemp
–40°C
≤ T
A
≤ 85°C
0.1
nA/°C
Temperature
I
OS
Input Offset Current
V
CM
= 0V
11
65
nA (max)
Common-Mode Input Voltage Range
+14.1
(V+) – 2.0
V
IN-CM
V (min)
–13.9
(V-) + 2.0
CMRR
Common-Mode Rejection
–10V<Vcm<10V
120
110
dB (min)
Differential Input Impedance
30
k
Ω
Z
IN
Common Mode Input Impedance
–10V<Vcm<10V
1000
M
Ω
–10V<Vout<10V, R
L
= 600
Ω
140
125
A
VOL
Open Loop Voltage Gain
–10V<Vout<10V, R
L
= 2k
Ω
140
dB (min)
–10V<Vout<10V, R
L
= 10k
Ω
140
R
L
= 600
Ω
±13.6
±12.5
V
OUTMAX
Maximum Output Voltage Swing
R
L
= 2k
Ω
±14.0
V (min)
R
L
= 10k
Ω
±14.1
I
OUT
Output Current
R
L
= 600
Ω, V
S
= ±17V
±26
±23
mA (min)
+53
I
OUT-CC
Instantaneous Short Circuit Current
mA
–42
f
IN
= 10kHz
R
OUT
Output Impedance
Closed-Loop
0.01
Ω
Open-Loop
13
(1)
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.
(2)
Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured
specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed.
Some performance characteristics may degrade when the device is not operated under the listed test conditions.
specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed.
Some performance characteristics may degrade when the device is not operated under the listed test conditions.
(3)
Typical specifications are specified at +25ºC and represent the most likely parametric norm.
(4)
Tested limits are specified to AOQL (Average Outgoing Quality Level).
(5)
PSRR is measured as follows: V
OS
is measured at two supply voltages, ±5V and ±15V. PSRR = | 20log(
ΔV
OS
/
ΔV
S
) |.
Copyright © 2006–2013, Texas Instruments Incorporated
3
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