Texas Instruments 1.6 V, LLP-6, Temperature Switch and Temperature Sensor Evaluation Board LM26LVEB/NOPB LM26LVEB/NOPB 데이터 시트
제품 코드
LM26LVEB/NOPB
+1.6V to +5.5V
TRIP
TEST
V
TEMP
V
DD
OT
4
1
2
6
C
BP
R
IN
Input
Pin
C
FILTER
LM26LV
C
SAMPLE
Reset
Sample
GND
SAR Analog-to-Digital Converter
OT
5
3
C
PIN
LM26LV
2
GND
5
OVERTEMP
3
V
DD
4
1
NC
NC
Asserts when T
DIE
> T
TRIP
See text.
100k
NC
6
LM26LV
2
GND
5
OVERTEMP
3
VDD
4
1
NC
NC
Asserts when T
DIE
> T
TRIP
See text.
6
NC
SNIS144F – JULY 2007 – REVISED FEBRUARY 2013
Applications Circuits
Figure 23. Temperature Switch Using Push-Pull Output
Figure 24. Temperature Switch Using Open-Drain Output
Figure 25. Suggested Connection to a Sampling Analog-to-Digital Converter Input Stage
Most CMOS ADCs found in microcontrollers and ASICs have a sampled data comparator input structure. When
the ADC charges the sampling cap, it requires instantaneous charge from the output of the analog source such
as the LM26LV/LM26LV-Q1 temperature sensor and many op amps. This requirement is easily accommodated
by the addition of a capacitor (C
the ADC charges the sampling cap, it requires instantaneous charge from the output of the analog source such
as the LM26LV/LM26LV-Q1 temperature sensor and many op amps. This requirement is easily accommodated
by the addition of a capacitor (C
FILTER
). The size of C
FILTER
depends on the size of the sampling capacitor and the
sampling frequency. Since not all ADCs have identical input stages, the charge requirements will vary. This
general ADC application is shown as an example only.
general ADC application is shown as an example only.
Copyright © 2007–2013, Texas Instruments Incorporated
21
Product Folder Links: