Texas Instruments IC MCU 16B MSP430F2410TRGCT VQFN-64 TID MSP430F2410TRGCT 데이터 시트
제품 코드
MSP430F2410TRGCT
MSP430F23x
MSP430F24x(1)
MSP430F2410
MSP430F24x(1)
MSP430F2410
SLAS547I – JUNE 2007 – REVISED DECEMBER 2012
Flash Memory
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
V
CC
MIN
TYP
MAX
UNIT
V
CC (PGM/ERASE)
Program and erase supply voltage
2.2
3.6
V
f
FTG
Flash timing generator frequency
257
476
kHz
I
PGM
Supply current from V
CC
during program
2.2 V/3.6 V
1
5
mA
I
ERASE
Supply current from V
CC
during erase
2.2 V/3.6 V
1
7
mA
t
CPT
Cumulative program time
(1)
2.2 V/3.6 V
10
ms
t
CMErase
Cumulative mass erase time
2.2 V/3.6 V
20
ms
Program/Erase endurance
10
4
10
5
cycles
t
Retention
Data retention duration
T
J
= 25°C
100
years
t
Word
Word or byte program time
(2)
30
t
FTG
t
Block, 0
Block program time for first byte or word
(2)
25
t
FTG
Block program time for each additional
t
Block, 1-63
(2)
18
t
FTG
byte or word
t
Block, End
Block program end-sequence wait time
(2)
6
t
FTG
t
Mass Erase
Mass erase time
(2)
10593
t
FTG
t
Seg Erase
Segment erase time
(2)
4819
t
FTG
(1)
The cumulative program time must not be exceeded when writing to a 64-byte flash block. This parameter applies to all programming
methods: individual word/byte write and block write modes.
methods: individual word/byte write and block write modes.
(2)
These values are hardwired into the flash controller's state machine (t
FTG
= 1/f
FTG
).
RAM
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
MAX
UNIT
V
(RAMh)
RAM retention supply voltage
(1)
CPU halted
1.6
V
(1)
This parameter defines the minimum supply voltage V
CC
when the data in RAM remains unchanged. No program execution should
happen during this supply voltage condition.
JTAG Interface
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
V
CC
MIN
TYP
MAX
UNIT
2.2 V
0
5
f
TCK
TCK input frequency
See
(1)
MHz
3 V
0
10
R
Internal
Internal pulldown resistance on TEST
See
(2)
2.2 V, 3 V
25
60
90
k
Ω
(1)
f
TCK
may be restricted to meet the timing requirements of the module selected.
(2)
TMS, TDI/TCLK, and TCK pullup resistors are implemented in all versions.
JTAG Fuse
(1)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
MAX
UNIT
V
CC(FB)
Supply voltage during fuse-blow condition
T
A
= 25°C
2.5
V
V
FB
Voltage level on TEST for fuse blow
6
7
V
I
FB
Supply current into TEST during fuse blow
100
mA
t
FB
Time to blow fuse
1
ms
(1)
Once the fuse is blown, no further access to the JTAG/Test, Spy-Bi-Wire, and emulation feature is possible, and JTAG is switched to
bypass mode.
bypass mode.
66
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