Texas Instruments 1.5 Gbps 2x2 LVDS Crosspoint Switch SCAN90CP02EVK/NOPB SCAN90CP02EVK/NOPB 데이터 시트

 

National Semiconductor’s System Test Access Products Group provides this evaluation kit of 
the SCAN90CP02 to help demonstrate the use and performance of the device. 
 
The user must supply 3.3-volt power to the Evaluation board. The user also must provide the 
proper LVDS signal levels to the inputs of the device using a signal generator. 
 

 

 

This Evaluation board uses two SCAN90CP02 devices. Device U1 uses SMA connectors for 
both the non-inverting and inverting differential input and output signals for each channel (total 
of 8 SMA connectors for U1). This enables the use of high speed signals for evaluating the 
performance of the LVDS signal path. Inputs are terminated with 100

Ω. 

 
Device U2 may be used for both high speed LVDS evaluations and IEEE 1149.6 evaluations. 
Channel 0 of device U2 uses CAT5 connectors for the input and output signals to allow the use 
of “lossy” or inexpensive CAT5 cables as the interconnect medium. Inputs are terminated with 
100

Ω.  

 
Channel 1 of device U2 is used primarily for IEEE 1149.6 evaluations. The output of Channel 1 
is looped back to the inputs of Channel 1 through a fault network. Thus, the fault network may 
be exercised while monitoring the effects through the IEEE 1149.1 port at J1. Switches S1 thru 
S5 are used to insert faults for evaluating the IEEE 1149.6 features (refer to the table 2 and 
figure 2 below).  
 
Additionally, U2 may be configured as a switch, and a high speed signal may be passed thru the 
fault network. This enables the evaluation of interconnect faults on the LVDS signal integrity. 
 
Switches S6 thru S11 are used as control inputs for both U1 and U2. Switches are provided for 
the SELx inputs, for the Enable inputs, and the PEMxx inputs to define the output pre-emphasis 
levels (refer to table 1 and figure 1 below). 
 
 
For more details, refer to the attached schematic and the SCAN90CP02 datasheet.