Texas Instruments IC MCU 16B MSP430F235TPM LQFP-64 TID MSP430F235TPM 데이터 시트
제품 코드
MSP430F235TPM
TDI
TDO
TMS
TCK
Test
JTAG
and
Emulation
Module
Burn & T est
Fuse
Controlled by JTAG
Controlled by JTAG
Controlled
by JTAG
by JTAG
DV
CC
DV
CC
DV
CC
During Programming Activity and
During Blowing of the Fuse, Pin
TDO/TDI Is Used to Apply the Test
Input Data for JTAG Circuitry
During Blowing of the Fuse, Pin
TDO/TDI Is Used to Apply the Test
Input Data for JTAG Circuitry
TDO/TDI
TDI/TCLK
TMS
TCK
Fuse
DV
CC
MSP430F23x
MSP430F24x(1)
MSP430F2410
MSP430F24x(1)
MSP430F2410
SLAS547I – JUNE 2007 – REVISED DECEMBER 2012
JTAG Pins (TMS, TCK, TDI/TCLK, TDO/TDI), Input/Output With Schmitt Trigger
78
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