Texas Instruments IC MCU 16B MSP430F2417TPM LQFP-64 TID MSP430F2417TPM 데이터 시트
제품 코드
MSP430F2417TPM
RLoad
AVCC
CLoad = 100pF
2
DAC Output
RO/P(DAC12.x)
ILoad
Conversion 1
Conversion 2
VOUT
Conversion 3
Glitch
Energy
+/− 1/2 LSB
+/− 1/2 LSB
tsettleLH
tsettleHL
= 3 kΩ
MSP430F261x
MSP430F241x
MSP430F241x
SLAS541K – JUNE 2007 – REVISED NOVEMBER 2012
12-Bit DAC Dynamic Specifications
V
REF
= V
CC
, DAC12IR = 1 (see
and
), over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
V
CC
MIN
TYP
MAX
UNIT
DAC12AMPx = 0
→
{2, 3, 4}
60
120
DAC12_xDAT = 800h,
t
ON
DAC12 on-time
Error
V(O)
< ±0.5 LSB
(1)
(see
DAC12AMPx = 0
→
{5, 6}
2.2 V, 3 V
15
30
µs
DAC12AMPx = 0
→
7
6
12
DAC12AMPx = 2
100
200
Settling time,
DAC12_xDAT =
t
S(FS)
DAC12AMPx = 3, 5
2.2 V, 3 V
40
80
µs
full scale
80h
→
F7Fh
→
80h
DAC12AMPx = 4, 6, 7
15
30
DAC12AMPx = 2
5
DAC12_xDAT =
Settling time,
t
S(C-C)
3F8h
→
408h
→
3F8h
DAC12AMPx = 3, 5
2.2 V, 3 V
2
µs
code to code
BF8h
→
C08h
→
BF8h
DAC12AMPx = 4, 6, 7
1
DAC12AMPx = 2
0.05
0.12
DAC12_xDAT =
SR
Slew rate
(2)
DAC12AMPx = 3, 5
2.2 V, 3 V
0.35
0.7
V/µs
80h
→
F7Fh
→
80h
DAC12AMPx = 4, 6, 7
1.5
2.7
DAC12AMPx = 2
600
Glitch energy, full
DAC12_xDAT =
DAC12AMPx = 3, 5
2.2 V, 3 V
150
nV-s
scale
80h
→
F7Fh
→
80h
DAC12AMPx = 4, 6, 7
30
DAC12AMPx = {2, 3, 4}, DAC12SREFx = 2, DAC12IR = 1,
40
DAC12_xDAT = 800h
3-dB bandwidth,
V
V
DC
= 1.5 V, V
AC
DAC12AMPx = {5, 6}, DAC12SREFx = 2, DAC12IR = 1,
BW
-3dB
2.2 V, 3 V
180
kHz
= 0.1 V
PP
(see
DAC12_xDAT = 800h
DAC12AMPx = 7, DAC12SREFx = 2, DAC12IR = 1,
550
DAC12_xDAT = 800h
DAC12_0DAT = 800h, No load,
DAC12_1DAT = 80h
DAC12_1DAT = 80h
↔
F7Fh, R
Load
= 3 k
Ω
,
-80
Channel-to-
f
DAC12_1OUT
= 10 kHz, Duty cycle = 50%
channel
2.2 V, 3 V
dB
crosstalk
(1)
(see
DAC12_0DAT = 80h
↔
F7Fh, R
Load
= 3 k
Ω
,
DAC12_1DAT = 800h, No load, f
DAC12_0OUT
= 10 kHz,
-80
Duty cycle = 50%
(1)
R
Load
and C
Load
are connected to AV
SS
(not AV
CC
/2) in
(2)
Slew rate applies to output voltage steps
≥
200 mV.
Figure 45. Settling Time and Glitch Energy Testing
70
Copyright © 2007–2012, Texas Instruments Incorporated