Texas Instruments IC MCU 16B MSP430F2232IRHAT VQFN-40 TID MSP430F2232IRHAT 데이터 시트
제품 코드
MSP430F2232IRHAT
MSP430F22x2
MSP430F22x4
MSP430F22x4
SLAS504G – JULY 2006 – REVISED AUGUST 2012
JTAG and Spy-Bi-Wire Interface
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
V
CC
MIN
TYP
MAX
UNIT
f
SBW
Spy-Bi-Wire input frequency
2.2 V, 3 V
0
20
MHz
t
SBW,Low
Spy-Bi-Wire low clock pulse length
2.2 V, 3 V
0.025
15
µs
Spy-Bi-Wire enable time
t
SBW,En
2.2 V, 3 V
1
µs
(TEST high to acceptance of first clock edge
(1)
)
t
SBW,Ret
Spy-Bi-Wire return to normal operation time
2.2 V, 3 V
15
100
µs
2.2 V
0
5
MHz
f
TCK
TCK input frequency
(2)
3 V
0
10
MHz
R
Internal
Internal pulldown resistance on TEST
2.2 V, 3 V
25
60
90
k
Ω
(1)
Tools accessing the Spy-Bi-Wire interface need to wait for the maximum t
SBW,En
time after pulling the TEST/SBWCLK pin high before
applying the first SBWCLK clock edge.
(2)
f
TCK
may be restricted to meet the timing requirements of the module selected.
JTAG Fuse
(1)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
MAX
UNIT
V
CC(FB)
Supply voltage during fuse-blow condition
T
A
= 25°C
2.5
V
V
FB
Voltage level on TEST for fuse blow
6
7
V
I
FB
Supply current into TEST during fuse blow
100
mA
t
FB
Time to blow fuse
1
ms
(1)
Once the fuse is blown, no further access to the JTAG/Test, Spy-Bi-Wire, and emulation feature is possible, and JTAG is switched to
bypass mode.
bypass mode.
Copyright © 2006–2012, Texas Instruments Incorporated
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