Freescale Semiconductor FRDM-FXS-MULTI 데이터 시트

Sensors

14

Freescale Semiconductor, Inc.

This section contains electrical specification tables and reference timing diagrams for the MMA955xL device, including detailed 
information on power considerations, DC/AC electrical characteristics, and AC timing specifications.

Cross-axis sensitivity

The proportionality constant that relates a variation of accelerometer output to cross acceleration. This 

sensitivity varies with the direction of cross acceleration and is primarily due to misalignment.

Full range

The algebraic difference between the upper and lower values of the input range. Refer to the input/

output characteristics.

Hardware compensated Sensor modules on this device include hardware-correction factors for gain and offset errors that are 

calibrated during factory test using a least-squares fit of the raw sensor data.

Linearity error

The deviation of the sensor output from a least-squares linear fit of the input/output data.

Nonlinearity

The systematic deviation from the straight line that defines the nominal input/output relationship.

Pin group

the clustering of device pins into a number of logical pin groupings to simplify and standardize electrical 

data sheet parameters. Pin groups are defined in 

Software compensated

Freescale’s advanced non-linear calibration functions that—with the first-order hardware gain and off-

set calibration features—improve sensor performance.

Warm-up time

The time from the initial application of power for a sensor to reach its specified performance under the 

documented operating conditions.

The following pin groups are used throughout the remainder of this section.

Group 1

RESETB

Group 2

RESERVED

Group 3

RGPIO[9:0]

Absolute maximum ratings are the limits the device can be exposed to without permanently damaging it. Absolute maximum rat-
ings are stress ratings only; functional operation at these ratings is not guaranteed. Exposure to absolute maximum ratings con-
ditions for extended periods may affect reliability.

This device contains circuitry to protect against damage due to high static voltage or electrical fields. It is advised, however, that 
normal precautions be taken to avoid application of any voltages higher than maximum-rated voltages to this high-impedance 
circuit. Reliability of operation is enhanced if unused inputs are tied to an appropriate logic voltage level (for instance, either V

SS

 

or V

DD

).

Digital supply voltage

V

DD

-0.3

2.0

V

Analog supply voltage

V

DDA

-0.3

2.0

V

Voltage difference, V

DD

 to V

DDA

V

DD

 - V

DDA

-0.1

0.1

V

Voltage difference, V

SS

 to V

SSA

V

SS

 - V

SSA

-0.1

0.1

V

Input voltage

V

In

-0.3

V

DD

 + 0.3

V

Input/Output pin-clamp current

I

C

-20

20

mA

Output voltage range (Open-Drain Mode)

V

OUTOD

-0.3

V

DD

 + 0.3

V

Storage temperature

T

stg

-40

125

C

Mechanical shock

SH

5k

g