Freescale Semiconductor FRDM-FXS-MULTI 데이터 시트
FXOS8700CQ
Sensors
12
Freescale Semiconductor, Inc.
4
Device Characteristics
4.1
Mechanical characteristics (accelerometer)
Table 2. Mechanical characteristics @ VDD = 2.5 V, VDDIO = 1.8 V T = 25 °C unless otherwise noted.
Parameter
Test Conditions
Symbol
Min
Typ
Max
Unit
Measurement range
(1)
1. Dynamic range is limited to ±4 g when in the low-noise mode.
±2 g mode
FS
ACC
±2
g
±4 g mode
±4
±8 g mode
±8
Sensitivity
±2 g mode
SEN
ACC
4096
LSB/g
0.244
mg/LSB
±4 g mode
2048
LSB/g
0.488
mg/LSB
±8 g mode
1024
LSB/g
0.976
mg/LSB
Sensitivity change with temperature
±2 g, ±4 g, ±8 g modes
TCS
ACC
±0.01
%/°C
Sensitivity accuracy
@ 25 °C
SEN-TOL
ACC
±2.5
%SEN
ACC
Zero-g level offset accuracy
(2)
2. Before board mount.
±2 g, ±4 g, ±8 g modes
OFF
ACC
±20
mg
Zero-g level offset accuracy post-board mount
(3)
3. Post-board mount offset specifications are based on a 2-layer PCB design.
±2 g, ±4 g, ±8 g modes
OFF
ACC-PBM
±30
mg
Zero-g level change versus temperature
-40 °C to 85 °C
TCO
ACC
±0.2
mg/°C
Nonlinearity (deviation from straight line)
(4)(5)
4. Evaluation only.
5. After post-board mount corrections for sensitivity, cross axis and offset. Refer to AN4399 for more information.
5. After post-board mount corrections for sensitivity, cross axis and offset. Refer to AN4399 for more information.
Over ±1 g range normal mode
NL
ACC
±0.5
%FS
ACC
Self-Test output change
(6)
X
Y
Z
Y
Z
6. Self-test is only exercised along one direction for each sensitive axis.
Set to ±2 g mode
STOC
ACC
+192
+270
+270
+1275
LSB
Output noise density
(4)(7)
7. Measured using earth's gravitational field (1 g) with the device oriented horizontally (+Z axis up) and stationary.
ODR = 400 Hz, normal mode
ND
ACC-NM
126
µg/
√Hz
ODR = 400 Hz, low-noise mode
ND
ACC-LNM
99
µg/
√Hz
Operating temperature range
Top
-40
+85
°C