Atmel ARM-Based Evaluation Kit AT91SAM9N12-EK AT91SAM9N12-EK 데이터 시트
제품 코드
AT91SAM9N12-EK
Tightly-Coupled Memory Interface
5-28
Copyright © 2001-2003 ARM Limited. All rights reserved.
ARM DDI0198D
Figure 5-19 TCM test access using BIST
This is similar to the previous DMA example. However, for BIST testing it is necessary
for the BIST controller to be able to force the memory chip select to both HIGH and
LOW values. This requirement means that it is necessary to hold the ARM926EJ-S core
in such a state that the internal value of the chip select is guranteed to be LOW. This can
be done by holding the ARM926EJ-S in reset (HRESETn LOW) during TCM memory
BIST testing. Note that this requires that HRESETn cannot also be used as a reset
control to the BIST controller.
for the BIST controller to be able to force the memory chip select to both HIGH and
LOW values. This requirement means that it is necessary to hold the ARM926EJ-S core
in such a state that the internal value of the chip select is guranteed to be LOW. This can
be done by holding the ARM926EJ-S in reset (HRESETn LOW) during TCM memory
BIST testing. Note that this requires that HRESETn cannot also be used as a reset
control to the BIST controller.
SRAM
DRWD[31:0]
BISTRD[31:0]
DRWBL[3:0]
DRDMAADDR[17:0]
CS
WD[31:0]
ARM926EJ-S
1
0
0
BIST
1
0
0
1
0
0
BISTWBL[3:0]
BISTnRW
BISTWD[31:0]
BISTEN
BISTADDR[17:0]
DRDMAEN
DRDMACS
DRnRW
RD[31:0]
WBL[3:0]
nRW
A[17:0]
DRADDR[17:0]
DRCS
DRWAIT
DRSEQ
BISTCS
BISTRSTn
HRESETn