Fairchild Semiconductor N/A FFB2227A 데이터 시트

© 1998 Fairchild Semiconductor Corporation

  www.fairchildsemi.com

FFB2227A / FMB2227A Rev. 1.1.0

2 

(1)

Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be opera-

ble above the recommended operating conditions and stressing the parts to these levels is not recommended. In addi-

tion, extended exposure to stresses above the recommended operating conditions may affect device reliability. The

absolute maximum ratings are stress ratings only. Values are at T

A

 = 25°C unless otherwise noted.

Notes:
1. These ratings are based on a maximum junction temperature of 150

°C.

2. These are steady-state limits. Fairchild Semiconductor should be consulted on applications involving pulsed 
    or low-duty cycle operations.
3. All voltages (V) and currents (A) are negative polarity for PNP transistors.
4. These Ratings are limiting values above which the serviceability of any semiconductor device may be impaired.

(2)

Values are at T

A

 = 25°C unless otherwise noted.

Note:
2. PCB board size: FR-4 76 x 114 x 0.6T mm

3

(3.0 inch x 4.5 inch x 0.062 inch) with minimum land pattern size.

V

CEO

Collector-Emitter Voltage

30

V

V

CBO

Collector-Base Voltage

60

V

V

EBO

Emitter-Base Voltage

5

V

I

C

Collector Current - Continuous

500

mA

T

J, 

T

STG

 

Operating and Storage Junction Temperature Range

- 55 to +150

°C

P

D

Total Device Dissipation

300

700

mV

Derate Above 25

°C

2.4

5.6

mV/

°C

R

θJA

Thermal Resistance, Junction to Ambient

415

180

°C/W