사용자 설명서차례Features1Configurations1Functional Description1Selection Guide1Logic Block Diagram (CY7C1318CV18)2Logic Block Diagram (CY7C1320CV18)2Pin Configuration3165-Ball FBGA (13 x 15 x 1.4 mm) Pinout3Pin Definitions4Functional Overview6Read Operations6Write Operations6Byte Write Operations6Single Clock Mode6DDR Operation6Depth Expansion6Programmable Impedance7Echo Clocks7DLL7Application Example7Truth Table8Burst Address Table (CY7C1318CV18, CY7C1320CV18)8Write Cycle Descriptions8Write Cycle Descriptions9IEEE 1149.1 Serial Boundary Scan (JTAG)10Disabling the JTAG Feature10Test Access Port-Test Clock10Test Mode Select (TMS)10Test Data-In (TDI)10Test Data-Out (TDO)10Performing a TAP Reset10TAP Registers10Instruction Register10Bypass Register10Boundary Scan Register10Identification (ID) Register10TAP Instruction Set10IDCODE11SAMPLE Z11SAMPLE/PRELOAD11BYPASS11EXTEST11EXTEST OUTPUT BUS TRISTATE11Reserved11TAP Controller State Diagram12TAP Controller Block Diagram13TAP Electrical Characteristics13TAP AC Switching Characteristics14TAP Timing and Test Conditions14Identification Register Definitions15Scan Register Sizes15Instruction Codes15Boundary Scan Order16Power Up Sequence in DDR II SRAM17Power Up Sequence17DLL Constraints17Maximum Ratings18Operating Range18Neutron Soft Error Immunity18Electrical Characteristics18DC Electrical Characteristics18AC Electrical Characteristics19Capacitance19Thermal Resistance19Switching Characteristics20Switching Waveforms22Ordering Information23Package Diagram24Document History Page25Sales, Solutions, and Legal Information26Worldwide Sales and Design Support26Products26크기: 1.09메가바이트페이지: 26Language: English매뉴얼 열기
사용자 설명서차례Features1Configurations1Functional Description1Selection Guide1Logic Block Diagram (CY7C1318CV18)2Logic Block Diagram (CY7C1320CV18)2Pin Configuration3165-Ball FBGA (13 x 15 x 1.4 mm) Pinout3Pin Definitions4Functional Overview6Read Operations6Write Operations6Byte Write Operations6Single Clock Mode6DDR Operation6Depth Expansion6Programmable Impedance7Echo Clocks7DLL7Application Example7Truth Table8Burst Address Table (CY7C1318CV18, CY7C1320CV18)8Write Cycle Descriptions8Write Cycle Descriptions9IEEE 1149.1 Serial Boundary Scan (JTAG)10Disabling the JTAG Feature10Test Access Port-Test Clock10Test Mode Select (TMS)10Test Data-In (TDI)10Test Data-Out (TDO)10Performing a TAP Reset10TAP Registers10Instruction Register10Bypass Register10Boundary Scan Register10Identification (ID) Register10TAP Instruction Set10IDCODE11SAMPLE Z11SAMPLE/PRELOAD11BYPASS11EXTEST11EXTEST OUTPUT BUS TRISTATE11Reserved11TAP Controller State Diagram12TAP Controller Block Diagram13TAP Electrical Characteristics13TAP AC Switching Characteristics14TAP Timing and Test Conditions14Identification Register Definitions15Scan Register Sizes15Instruction Codes15Boundary Scan Order16Power Up Sequence in DDR II SRAM17Power Up Sequence17DLL Constraints17Maximum Ratings18Operating Range18Neutron Soft Error Immunity18Electrical Characteristics18DC Electrical Characteristics18AC Electrical Characteristics19Capacitance19Thermal Resistance19Switching Characteristics20Switching Waveforms22Ordering Information23Package Diagram24Document History Page25Sales, Solutions, and Legal Information26Worldwide Sales and Design Support26Products26크기: 1.07메가바이트페이지: 26Language: English매뉴얼 열기
