사용자 설명서 (MMDOE56G5MXP-0VB)차례1.0 General Description52.0 Mechanical Specification62.1 Physical dimensions and Weight63.0 Product Specifications73.1 System Interface and Configuration73.2 System Performance73.3 Drive Capacity73.4 Supply Voltage73.5 System Power Consumption*73.6 System Reliability73.7 Environmental Specifications84.0 Electrical Interface Specification94.1 Serial ATA Interface connector94.2 Pin Assignments105.0 Frame Information Structure (FIS)115.1 Register - Host to Device115.2 Register - Device to Host125.3 Data135.4 PIO Setup135.5 DMA Activate - Device to Host145.6 DMA Setup145.7 Set Device Bits - Device to Host146.0 Shadow Register Block registers Description156.1 Command Register156.2 Device Control Register156.2.1 1 Field / bit description156.3 Device / Head Register156.3.1 1 Field / bit description156.4 Error Register156.4.1 1 Field / bit description156.5 Features Register166.6 Cylinder High (LBA High) Register166.7 Cylinder Low (LBA Mid) Register166.8 Sector Number (LBA low) Register166.9 Sector Count Register166.10 Status Register166.10.1 1 Field / bit description167.0 Command Descriptions177.1 Supported ATA Commands177.2 SECURITY FEATURE Set187.2.1 1 SECURITY mode default setting187.2.2 1 Initial setting of the user password187.2.3 1 SECURITY mode operation from power-on187.2.4 1 Password lost187.3 SMART FEATURE Set (B0h)187.3.1 1 Sub Command187.3.1.2 S.M.A.R.T. Read Attribute Values (subcommand D0h)187.3.1.3 S.M.A.R.T. Read Attribute Thresholds (subcommand D1h)187.3.1.4 S.M.A.R.T. Enable/Disable Attribute Autosave (subcommand D2h)197.3.1.5 S.M.A.R.T. Save Attribute Values (subcommand D3h)197.3.1.6 S.M.A.R.T. Execute Off-line Immediate (subcommand D4h)197.3.1.7 S.M.A.R.T. Selective self-test routine207.3.1.8 S.M.A.R.T. Read Log Sector (subcommand D5h)217.3.1.9 S.M.A.R.T. Write Log Sector (subcommand D6h)217.3.1.10 S.M.A.R.T. Enable Operations (subcommand D8h)217.3.1.11 S.M.A.R.T. Disable Operations (subcommand D9h)217.3.1.12 S.M.A.R.T. Return Status (subcommand DAh)227.3.1.13 S.M.A.R.T. Enable/Disable Automatic Off-line (subcommand DBh)227.3.2 1 Device Attribute Data Structure237.3.2.2 Data Structure Revision Number247.3.2.3 Individual Attribute Data Structure247.3.2.4 Off-Line Data Collection Status247.3.2.5 Self-test execution status257.3.2.6 Total time in seconds to complete off-line data collection activity257.3.2.7 Current segment pointer257.3.2.8 Off-line data collection capability257.3.2.9 S.M.A.R.T. Capability257.3.2.10 Error logging capability267.3.2.11 Self-test failure check point267.3.2.12 Self-test completion time267.3.2.13 Data Structure Checksum267.3.3 1 Device Attribute Thresholds data structure267.3.3.2 Data Structure Revision Number267.3.3.3 Individual Thresholds Data Structure267.3.3.4 Attribute ID Numbers267.3.3.5 Attribute Threshold277.3.3.6 Data Structure Checksum277.3.4 1 S.M.A.R.T. Log Directory277.3.5 1 S.M.A.R.T. error log sector277.3.5.2 S.M.A.R.T. error log version277.3.5.3 Error log pointer277.3.5.4 Device error count287.3.5.5 Error log data structure287.3.5.6 Command data structure287.3.5.7 Error data structure297.3.6 1 Self-test log structure307.3.7 1 Selective self-test log data structure307.3.8 1 Error reporting318.0 OOB signaling and Phy Power State318.1 OOB signaling318.1.1 1 OOB signal spacing318.2 Phy Power State328.2.1 1 COMRESET sequence state diagram328.2.2 1 Interface Power States328.2.2.2 PHYRDY328.2.2.3 Partial328.2.2.4 Slumber328.2.3 1 Partial/Slumber to PHYRDY328.2.3.2 Host Initiated328.2.3.3 Device Initiated328.2.4 1 PHYRDY to Partial/Slumber338.2.4.2 Host Initiated for Partial338.2.4.3 Device Initiated for Partial339.0 SATA II Optional Feature349.1 Power Segment Pin P11349.2 Activity LED indication349.3 Asynchronous Signal Recovery3410.0 Identify Device Data3511.0 Ordering Information3712.0 Product Line up37크기: 1.29메가바이트페이지: 37Language: English매뉴얼 열기
