Cypress STK15C88 Manual Do Utilizador

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STK15C88
Document Number: 001-50593 Rev. **
Page 7 of 15
Data Retention and Endurance
Parameter
Description
Min
Unit
DATA
R
Data Retention
100
Years
NV
C
Nonvolatile STORE Operations
1,000
K
Capacitance
In the following table, the capacitance parameters are listed.
Parameter
Description
Test Conditions
Max
Unit
C
IN
Input Capacitance
T
A
 = 25
°C, f = 1 MHz,
V
CC
 = 0 to 3.0 V
5
pF
C
OUT
Output Capacitance
7
pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed.
Parameter
Description
Test Conditions
28-SOIC 
(300 mil)
28-SOIC 
(330 mil)
Unit
Θ
JA
Thermal Resistance
(Junction to Ambient)
Test conditions follow standard test methods and 
procedures for measuring thermal impedance, 
per EIA / JESD51.
TBD
TBD
°C/W
Θ
JC
Thermal Resistance
(Junction to Case)
TBD
TBD
°C/W
Figure 4.  AC Test Loads 
AC Test Conditions
5.0V
Output
30 pF
R1 480
Ω
R2
255
Ω
Input Pulse Levels .................................................. 0 V to 3 V
Input Rise and Fall Times (10% - 90%)........................ <5 ns
Input and Output Timing Reference Levels ................... 1.5 V
Note
4. These parameters are guaranteed by design and are not tested.