Toshiba PSAGAX Manual Do Utilizador

Satellite A300,Satellite Pro A300, EQUIUM A300,SATEGO A300 Maintenance Manual 

test coverage would be based on the setting and the value in ‘Percent (%) 
mentioned at below. 

Pattern Size: Choose the pattern size – BYTE, WORD, DWORD or ALL. 

Percent (%): Choose the percentage of the defined range of the memory to 
be tested. 

Time Limit(h): Choose or Input the time (hour) of the defined range of the 
memory to be tested. 

Time Limit(m): Choose or Input the time (minute) of the defined range of 
the memory to be tested. 

1.  Bit Stuck High Test 

Data pattern: Every bit is ‘1’ (Each bit is high) 

2.  Bit Stuck Low Test 

Data pattern: Every bit is ‘0'(Each bit is low); 

3.  Checker Board Test 

Data pattern: Lo-byte and hi-byte are composed with 0101(0x5) and 1010 
(0xA); 

4.  CAS Line Test 

Data pattern: Lo-byte and hi-byte are composed with 0000 (0x0) and 
1111(0xF); 

5.  Incremental Test 

Data pattern: A series of increasing data from 0 by adding 1 each time; 

6.  Decrement Test 

Data Pattern: A series of decreasing data from the maximum (e.g. 0xFFFF) by 
subtracting 1 each time; 

7.  Incremental / Decrement Test 

Data Pattern is a series of data whose low byte is increasing data from 0x00 
and high byte is decreasing data from 0xFF.