Toshiba PSAGRX Manual Do Utilizador

Test by using read instructions. 

The test item is to ensure that there is no short circuitry issue in memory chip. The 

parameter dialog window is the same as that in ‘Subtest 02 Pattern’. 

The test item is to ensure that there is no open circuitry issue in memory chip. The 

parameter dialog window is the same as that in ‘Subtest 02 Pattern’. 

This test item is to check short and open issue on memory address lines. 

This test item is to check whether the memory refresh works normally. The 

parameter dialog window is as follows: 

 

The test item is to check whether the CPU internal cache memory could be 

accessed correctly. 

Random Memory test includes the following two test items: Randomize Test and 

Random Incremental Read/Write Test. The parameter dialog window is the same 
as that in ‘Subtest 03 Extended Pattern’. 

1.  Randomize Test 

This test item is to check whether the memory could be correctly accessed 
with randomized data and randomized memory address. 

2.  Random Increment Read/Write 

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