Toshiba PRO L645 Manual Do Utilizador

Subtest 04 

Bit Shift Pattern Test 

This subtest reads the contents of cache memory and saves it into RAM. The 
subtest then writes the bit shift data patterns (1 bit shifted every 4 bytes

), 

reads 

the new data and compares the result with the original data. The original 
cache memory content is then restored to the cache memory. 

Subtest 05 

Write Disturb Test (We can’t support this time) 

This subtest reads the contents of cache memory and saves it into RAM. The 
subtest then writes the “write disturb data,” reads the new data and compares 
the result with the original data. The original cache memory content is then 
restored to the cache memory. 

Subtest 06 

Checker Board Test  

This subtest reads the contents of cache memory and saves it into RAM. The 
subtest then writes the “checker board data,” (data which is inverted 
front/back and left/right) reads the new data and compares the result with the 
original data. The original cache memory content is then restored to the cache 
memory. 

Subtest 07 

Marching Test 

This subtest reads the contents of cache memory and saves it into RAM. The 
subtest then writes the “marching data,” 

(00H through 01H and 01H through 

00H) 

reads the new data and compares the result with the original data. The 

original cache memory content is then restored to the cache memory. 

Subtest 08 

Working Data Test  

This subtest reads the contents of cache memory and saves it into RAM. The 
subtest then writes the “working data,”

 

reads the new data and compares the 

result with the original data. The original cache memory content is then 
restored to the cache memory.