Toshiba TECRA S1 Manual Do Utilizador

1.  Bit Stuck High Test 

Data pattern: Every bit is ‘1’ (Each bit is high) 

2.  Bit Stuck Low Test 

Data pattern: Every bit is ‘0'(Each bit is low); 

3.  Checker Board Test 

Data pattern: Lo-byte and hi-byte are composed with 0101(0x5) and 1010 
(0xA); 

4.  CAS Line Test 

Data pattern: Lo-byte and hi-byte are composed with 0000 (0x0) and 
1111(0xF); 

5. Incremental Test 

Data pattern: A series of increasing data from 0 by adding 1 each time; 

6. Decrement Test 

Data Pattern: A series of decreasing data from the maximum (e.g. 0xFFFF) by 
subtracting 1 each time; 

7.  Incremental / Decrement Test 

Data Pattern is a series of data whose low byte is increasing data from 0x00 
and high byte is decreasing data from 0xFF. 

In addition to the above pattern test with the memory, there are Read/Write Cycle 

test and Read Cycle Test for the extended memory. 

Below is the parameter dialog window of the extended pattern test.