Texas Instruments DAC8832EVM-PDK - DAC8832 Performance Demonstration Kit DAC8832EVM-PDK DAC8832EVM-PDK Ficha De Dados
Códigos do produto
DAC8832EVM-PDK
www.ti.com
EVM Operation
2.2
EVM Performance Results
The EVM performance test is performed using a high density DAC bench test board, an Agilent 3458A
digital multimeter and a PC running the LabVIEW
digital multimeter and a PC running the LabVIEW
®
software. The EVM board is tested for all codes of the
device under test (DUT) and is allowed to settle for 1ms before the meter is read. This process is repeated
for all codes to generate the measurements for INL and DNL results.
for all codes to generate the measurements for INL and DNL results.
The results of the DAC8831/32EVM characterization test are shown in
. Take note that the
DAC8831/32 uses the OPA735 for the output buffer.
Figure 6. INL and DNL Characterization Plot for the DAC8832
3
EVM Operation
This chapter covers in detail the operation of the EVM to provide guidance to the user in evaluating the
onboard DAC and how to interface the EVM to a host processor.
onboard DAC and how to interface the EVM to a host processor.
Refer to the specific DAC data sheet, as listed in the Related Documentation from Texas Instruments
section of this user’s guide for more information about the DAC’s serial interface and other related topics.
section of this user’s guide for more information about the DAC’s serial interface and other related topics.
The EVM board is factory tested and configured to operate in the bipolar output mode.
7
SLAU202A – December 2006 – Revised November 2009
DAC8831/32 Evaluation Module
Copyright © 2006–2009, Texas Instruments Incorporated