Freescale Semiconductor Tower System Eval Kit for MC9S12GN32 TWR-S12GN32-KIT TWR-S12GN32-KIT Ficha De Dados
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Códigos do produto
TWR-S12GN32-KIT
128 KByte Flash Module (S12FTMRG128K1V1)
MC9S12G Family Reference Manual, Rev.1.23
Freescale Semiconductor
1037
•
Single bit fault correction and double bit fault detection within a 32-bit double word during read
operations
operations
•
Automated program and erase algorithm with verify and generation of ECC parity bits
•
Fast sector erase and phrase program operation
•
Ability to read the P-Flash memory while programming a word in the EEPROM memory
•
Flexible protection scheme to prevent accidental program or erase of P-Flash memory
29.1.2.2
EEPROM Features
•
4 Kbytes of EEPROM memory composed of one 4 Kbyte Flash block divided into 1024 sectors of
4 bytes
4 bytes
•
Single bit fault correction and double bit fault detection within a word during read operations
•
Automated program and erase algorithm with verify and generation of ECC parity bits
•
Fast sector erase and word program operation
•
Protection scheme to prevent accidental program or erase of EEPROM memory
•
Ability to program up to four words in a burst sequence
29.1.2.3
Other Flash Module Features
•
No external high-voltage power supply required for Flash memory program and erase operations
•
Interrupt generation on Flash command completion and Flash error detection
•
Security mechanism to prevent unauthorized access to the Flash memory
29.1.3
Block Diagram
The block diagram of the Flash module is shown in
.