Intel 4 HT 631 80552PG0802M2M Ficha De Dados

26

Datasheet

.

I

LI

Input Leakage 
Current

N/A

± 200

µA

9

I

LO

Output Leakage 
Current

N/A

± 200

µA

10

R

ON

Buffer On Resistance

6

12

W

1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.

2. V

IL

 is defined as the voltage range at a receiving agent that will be interpreted as a logical low value.

3. LINT0/INTR and LINT1/NMI use GTLREF as a reference voltage. For these two signals,  

V

IH

 = GTLREF + (0.10 * V

TT

) and V

IL

= GTLREF – (0.10 * V

TT

).

4. V

IH

 is defined as the voltage range at a receiving agent that will be interpreted as a logical high value. 

5. V

IH

 and V

OH

 may experience excursions above V

TT

. However, input signal drivers must comply with the signal quality 

specifications.

6. The V

TT

 referred to in these specifications refers to instantaneous V

TT

.

7. All outputs are open drain.

8. The maximum output current is based on maximum current handling capability of the buffer and is not specified into 

the test load.

9. Leakage to V

SS

 with land held at V

TT

.

10.Leakage to V

TT

 with land held at 300 mV.

1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.

2. All outputs are open drain.

V

HYS

Input Hysteresis

120

396

mV

3

3.

V

HYS

 represents the amount of hysteresis, nominally centered about 0.5 * V

TT

, for all TAP inputs.

V

T+

PWRGOOD Input low-
to-high threshold 
voltage

0.5 * (V

TT + 

V

HYS_MIN 

+ 0.24)

0.5 * (V

TT + 

V

HYS_MAX 

+ 0.24)

V

4,  5

4. The V

TT

 referred to in these specifications refers to instantaneous V

TT

.

5. 0.24 V is defined at 20% of nominal V

TT

 of 1.2 V.

TAP Input low-to-high 
threshold voltage

0.5 * (V

TT + 

V

HYS_MIN

) 0.5 * (V

TT + 

V

HYS_MAX

)

V

V

T-

PWRGOOD Input high-
to-low threshold 
voltage

0.4 * V

TT

0.6 * V

TT

V

TAP Input high-to-low 
threshold voltage

0.5 * (V

TT 

– V

HYS_MAX

) 0.5 * (V

TT 

– V

HYS_MIN

)

V

V

OH

Output High Voltage

N/A

V

TT

V

, 6

6. The TAP signal group must meet the signal quality specifications.

I

OL

Output Low Current

—

22.2

mA

7

7. The maximum output current is based on maximum current handling capability of the buffer and is not specified into 

the test load.

I

LI

Input Leakage Current

—

± 200

µA

8

8. Leakage to Vss with land held at V

TT

.

I

LO

Output Leakage Current

—

± 200

µA

9

9. Leakage to V

TT

 with land held at 300 mV.

R

ON

Buffer On Resistance

6

12

W