Kowa AP-7000 Manual Do Utilizador
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7.8. Sorting the examination results
You can sort the results based on the artifact and reliability index during the graphic display of the chronological change.
When you press [Artifact], it turns on and the graph of the examination result analysis index with the artifact is taken into
consideration.
Each time you press [Artifact], it is toggled between ON and OFF.
When you press [Reliability], it turns on and a graph is displayed excluding the examination results in which any of the
reliability indexes (fixation loss, false – positive reaction, and false – negative reaction) is equal to or more than the
reference value (20% or 33%).
Each time you press [Reliability], it is toggled between ON and OFF.
You can operate [Artifact] and [Reliability] individually, and also set both to ON at the same time.
When you press [Artifact], it turns on and the graph of the examination result analysis index with the artifact is taken into
consideration.
Each time you press [Artifact], it is toggled between ON and OFF.
When you press [Reliability], it turns on and a graph is displayed excluding the examination results in which any of the
reliability indexes (fixation loss, false – positive reaction, and false – negative reaction) is equal to or more than the
reference value (20% or 33%).
Each time you press [Reliability], it is toggled between ON and OFF.
You can operate [Artifact] and [Reliability] individually, and also set both to ON at the same time.
[Artifact] OFF, [Reliability] OFF [Artifact] ON, [Reliability] ON
While an MD or VFI graph is being displayed, you can select [Exception].
When you press [Exception] and specify an examination point which you wish to exclude, the excluded point is reflected
in the MD and VFI linear regressions.
When you press [Exception] and specify an examination point which you wish to exclude, the excluded point is reflected
in the MD and VFI linear regressions.
[Exception] OFF
[Exception] ON