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7-61

TEST(P),DTEST(P)

.4 Bit pr

oce
ssin
g instructions

.4.2 Bi

t te
sts (TES

T(P),DTEST(P))

7.4.2

Bit tests (TEST(P),DTEST(P))

TEST(P),DTEST(P)

Function

TEST

(1) Fetches bit data at the location designated by

within the word device designated by

and writes it to the bit device designated by

(2) The bit device designated by

is OFF when the relevant bit is "0" and ON when it is "1".

(3) The position designated by

indicates the position of an individual bit in a 1-word data

block (0 to 15). When 16 or more is designated at

, the target is the bit data at the position

indicated by the remainder of n / 16. For example, when n 18, the target is the data at b2
since the remainder of 18 / 16 1 is "2".

DTEST

(1) Fetches bit data at the location designated by

within the 2-word device designated by

+1, and writes it to the bit device designated by

(2) The bit device designated by

is OFF when the relevant bit is "0" and ON when it is "1".

: Number of the device where bit data to be extracted is stored (BIN 16 bits)

: Location of the bit data to be extracted (0 to 15 (TEST)/0 to 31 (DTEST)) (BIN 16/32 bits)

: Number of the bit device where the extracted data will be stored (bits)

Setting

Data

Internal Devices

R, ZR

Constants

K, H

Other

Bit

Word

Bit

Word

––

Basic

Process

High

performance

Redundant Universal

Command

TEST, DTEST

TESTP, DTESTP

indicates an instruction symbol of TEST/DTEST.

bit

b15

(When =5)