Справочник Пользователя для Benning IT 120 B 044102
Модели
044102
71
IT system function
Remarks
Continuity test
R low-Ω
independent of the selected power supply network
continuity test
Insulation
independent of the selected power supply network
Line impedance
line impedance
impedance Z
L1-L2
.
prospective short-circuit current
I
PSC
for nominal U
L1-L2
.
Fault loop impedance
not applicable
fault loop impedance
prospective fault current
Voltage, frequency
symbols adapted to the IT system
Phase shift
automatic recognition of three-phase mains
FI / RCD functions
partly applicable
contact voltage Uc
not applicable
tripping time
bridging, see figure 11.3
tripping current
automatic testing
Resistance to earth
independent of the selected power supply network
PE conductor test key (TEST key)
active, but does not influence testing, if a voltage is
detected
detected
11.3.1 Voltage
Figure 11.2: Example of voltage and frequency measurements
Shown results for a single-phase system:
L1-L2 voltage between external conductors,
L1-PE voltage between external conductor 1 and protective conductor,
L2-PE voltage between external conductor 2 and protective conductor.
L1-L2 voltage between external conductors,
L1-PE voltage between external conductor 1 and protective conductor,
L2-PE voltage between external conductor 2 and protective conductor.
11.3.2 Line impedance
For further information, please refer to chapter 5.5 „Line impedance and prospective short-circuit
current“. The measuring method is the same, but the indication of the terminal voltage corres-
ponds to the IT system.
current“. The measuring method is the same, but the indication of the terminal voltage corres-
ponds to the IT system.
11.3.3 FI/RCD testing
The FI/RCD test is carried out in the same way as it is done in a TN/TT system (see chapter 5.3
„Residual current protection devices (FI/RCD)“. However, there is the following exception:
„Residual current protection devices (FI/RCD)“. However, there is the following exception:
- The contact voltage measurement is irrelevant.
The test circuit with bridging should correspond to the circuit shown in figure 11.3.