Техническая Спецификация для Freescale Semiconductor Evaluation Board for MPC5500 Series MPC5554EVBE MPC5554EVBE

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MPC5554 Microcontroller Data Sheet, Rev. 4
Electrical Characteristics
Freescale Semiconductor
8
The thermal characterization parameter is measured in compliance with the JESD51-2 specification using 
a 40-gauge type T thermocouple epoxied to the top center of the package case. Position the thermocouple 
so that the thermocouple junction rests on the package. Place a small amount of epoxy on the thermocouple 
junction and approximately 1 mm of wire extending from the junction. Place the thermocouple wire flat 
against the package case to avoid measurement errors caused by the cooling effects of the thermocouple 
wire.
References:
Semiconductor Equipment and Materials International                                                                                                      
3081 Zanker Rd.
San Jose, CA., 95134
(408) 943-6900
MIL-SPEC and EIA/JESD (JEDEC) specifications are available from Global Engineering Documents at 
800-854-7179 or 303-397-7956.
JEDEC specifications are available on the web at
 http://www.jedec.org
.
1. C.E. Triplett and B. Joiner, “An Experimental Characterization of a 272 PBGA Within an Automotive 
Engine Controller Module,” Proceedings of SemiTherm, San Diego, 1998, pp. 47–54.
2. G. Kromann, S. Shidore, and S. Addison, “Thermal Modeling of a PBGA for Air-Cooled Applica-
tions,” Electronic Packaging and Production, pp. 53–58, March 1998.
3. B. Joiner and V. Adams, “Measurement and Simulation of Junction to Board Thermal Resistance and 
Its Application in Thermal Modeling,” Proceedings of SemiTherm, San Diego, 1999, pp. 212–220.
3.3
Package
Refer to 
 for pinouts and package drawings. 
3.4
EMI (Electromagnetic Interference) Characteristics
Table 4. EMI Testing Specifications 
1
1
EMI testing and I/O port waveforms per SAE J1752/3 issued 1995-03. Qualification testing was performed on the MPC5554 
and applied to the MPC5500 family as generic EMI performance data. 
Spec
Characteristic
Minimum
Typical
Maximum
Unit
1
Scan range
0.15
1000
MHz
2
Operating frequency
f
MAX
MHz
3
V
DD
 operating voltages
1.5
V
4
V
DDSYN
, V
RC33
, V
DD33
, V
FLASH
, V
DDE
 operating voltages
3.3
V
5
V
PP
, V
DDEH
, V
DDA
 operating voltages
5.0
V
6
Maximum amplitude
14 
2
32 
3
2
Measured with the single-chip EMI program.
3
Measured with the expanded EMI program.
dBuV
7
Operating temperature
25
o
C