Техническая Спецификация для Analog Devices AD5560 Evaluation Board EVAL-AD5560EBUZ EVAL-AD5560EBUZ
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Модели
EVAL-AD5560EBUZ
Data Sheet
AD5560
Rev. D | Page 15 of 68
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter
Rating
AV
DD
to AV
SS
34 V
AV
DD
to AGND
−0.3 V to +34 V
AV
SS
to AGND
−34 V to +0.3 V
HCAV
DD
x to HCAV
SS
x
34 V
HCAV
DD
x to AGND
−0.3 V to +34 V
HCAV
SS
x to AGND
−34 V to +0.3 V
HCAV
DD
x to AV
SS
−0.3 V to AV
SS
+ 34 V
HCAV
DD
x to AV
DD
−0.3 V to AV
DD
+ 0.3 V
HCAV
SS
x to AV
SS
+0.3 V to AV
SS
− 0.3 V
DV
CC
to DGND
−0.3 V to +7 V
AGND to DGND
−0.3 V to +0.3 V
REFGND to AGND
−0.3 V to +0.3 V
Digital Inputs to DGND
−0.3 V to DV
CC
+ 0.3 V
Analog Inputs to AGND
AV
SS
− 0.3 V to AV
DD
+ 0.3 V
EXTFORCE1 and EXTFORCE2 to AGND
AV
DD
− 28 V
Storage Temperature
−65°C to +125°C
Operating Junction Temperature
25°C to 90°C
Reflow Profile
J-STD 20 (JEDEC)
Junction Temperature
150°C max
Power Dissipation
10 W max (EXTFORCE1 stage)
5 W max (EXTFORCE2 stage)
ESD
HBM
1500 V
FICDM
500 V
1
When an EXTFORCE1 or EXTFORCE2 stage is enabled and the supply differ-
ential |AV
DD
− AV
SS
| > 28 V, take care to ensure that these pins are not directly
shorted to AV
SS
voltage at any time because this can cause damage to the device.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION