Техническая Спецификация для Atmel Xplained Pro Evaluation Kit ATSAMD20-XPRO ATSAMD20-XPRO
Модели
ATSAMD20-XPRO
46
Atmel | SMART SAM D20 [DATASHEET]
Atmel-42129K–SAM-D20_datasheet–06/2014
z
ADDR: Address of the word containing the failing bit.
z
DATA: contains data to identify which bit failed, and during which phase of the test it failed. The DATA
register will in this case contains the following bit groups:
register will in this case contains the following bit groups:
Table 12-4. DATA bits Description When MBIST Operation Returns An Error
z
bit_index: contains the bit number of the failing bit
z
phase: indicates which phase of the test failed and the cause of the error. See
.
12.11.6 System Services Availability When Accessed Externally
External access: Access performed in the DSU address offset 0x200-0x1FFF range.
Internal access: Access performed in the DSU address offset 0x0-0x100 range.
Bit
31
30
29
28
27
26
25
24
Bit
23
22
21
20
19
18
17
16
Bit
15
14
13
12
11
10
9
8
phase
Bit
7
6
5
4
3
2
1
0
bit_index
Table 12-5. MBIST Operation Phases
Phase
Test Actions
0
Write all bits to zero. This phase cannot fail.
1
Read 0, write 1, increment address
2
Read 1, write 0
3
Read 0, write 1, decrement address
4
Read 1, write 0, decrement address
5
Read 0, write 1
6
Read 1, write 0, decrement address
7
Read all zeros. bit_index is not used