Texas Instruments ADS61xx 用户手册
5
ADC Evaluation
5.1
Hardware Selection
5.1.1
Analog Input Signal Generator
5.1.2
Clock Signal Generator
ADC Evaluation
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This section describes how to set up a typical ADC evaluation system that is similar to what TI uses to
perform testing for data-sheet generation. Consequently, the information in this section is generic in nature
and is applicable to all high-speed, high-resolution ADC evaluations. This section covers signal tone
analysis, which yields ADC data-sheet figures of merit such as signal-to-noise ratio (SNR) and spurious
free dynamic range (SFDR).
perform testing for data-sheet generation. Consequently, the information in this section is generic in nature
and is applicable to all high-speed, high-resolution ADC evaluations. This section covers signal tone
analysis, which yields ADC data-sheet figures of merit such as signal-to-noise ratio (SNR) and spurious
free dynamic range (SFDR).
To reveal the true performance of the ADC under evaluation, great care should be taken in selecting both
the ADC signal source and ADC clocking source.
the ADC signal source and ADC clocking source.
When choosing the quality of the ADC analog input source, consider both harmonic distortion performance
of the signal generator and the noise performance of the source.
of the signal generator and the noise performance of the source.
In many cases, the harmonic distortion performance of the signal generator is inferior to that of the ADC,
and additional filtering is needed if users expect to reproduce the ADC SFDR numbers found in the data
sheet. Users can easily evaluate the harmonic distortion of the signal generator by hooking it directly to a
spectrum analyzer, measuring the power of the output signal, and comparing that to the power of the
integer multiples of the output signal frequency. If the harmonic distortion is worse than the ADC under
evaluation, the ADC digitizes the performance of the signal generator and the true SFDR of the ADC is
masked. To alleviate this, it is recommended that users provide additional LC filtering after the signal
generator output.
and additional filtering is needed if users expect to reproduce the ADC SFDR numbers found in the data
sheet. Users can easily evaluate the harmonic distortion of the signal generator by hooking it directly to a
spectrum analyzer, measuring the power of the output signal, and comparing that to the power of the
integer multiples of the output signal frequency. If the harmonic distortion is worse than the ADC under
evaluation, the ADC digitizes the performance of the signal generator and the true SFDR of the ADC is
masked. To alleviate this, it is recommended that users provide additional LC filtering after the signal
generator output.
Another important metric when deciding on a signal generator is its noise performance. As with the
distortion performance, if the noise performance is worse than that of the ADC under evaluation, the ADC
digitizes the performance of the source. Noise can be broken into two components, broadband noise and
close-in phase noise. Broadband noise can be improved by the LC filter added to improve distortion
performance; however, the close-in phase noise typically cannot be improved by additional filtering.
Therefore, when selecting an analog signal source, it is important to review the manufacturer's phase
noise plots and take care to choose a signal generator with the best phase-noise performance.
distortion performance, if the noise performance is worse than that of the ADC under evaluation, the ADC
digitizes the performance of the source. Noise can be broken into two components, broadband noise and
close-in phase noise. Broadband noise can be improved by the LC filter added to improve distortion
performance; however, the close-in phase noise typically cannot be improved by additional filtering.
Therefore, when selecting an analog signal source, it is important to review the manufacturer's phase
noise plots and take care to choose a signal generator with the best phase-noise performance.
Equally important in the high-performance ADC evaluation setup is the selection of the clocking source.
Most modern ADCs, the ADS61xx/ADS61B23 included, accept either a sinusoidal or a square-wave clock
input. The key metric in selecting a clocking source is selecting a source with the lowest jitter. This
becomes increasingly important as the ADC input frequency (f
Most modern ADCs, the ADS61xx/ADS61B23 included, accept either a sinusoidal or a square-wave clock
input. The key metric in selecting a clocking source is selecting a source with the lowest jitter. This
becomes increasingly important as the ADC input frequency (f
in
) increases, because the ADC SNR
evaluation setups can become jitter-limited (t
j
) as shown by the following equation.
SNR (dBc) = 20 log (2
π ×
f
in
×
t
j
(rms))
In theory, a square-wave source with femtosecond jitter would be ideal for an ADC evaluation setup.
However, in practical terms, most commercially available square-wave generators offer jitter measured in
picoseconds, which is too great for high-resolution ADC evaluation setups. Therefore, most evaluation
setups rely on the ADC internal clock buffer to convert a sinusoidal input signal into a ultralow-jitter square
wave. When selecting a sinusoidal clocking source, it has been shown that phase noise has a direct
impact on jitter performance. Consequently, great scrutiny should be applied to the phase-noise
performance of the clocking signal generator. TI has found that high-Q monolithic crystal filters can
improve the phase noise of the signal generator, and these filters become essential elements of the
evaluation setup when high ADC input frequencies are being evaluated.
However, in practical terms, most commercially available square-wave generators offer jitter measured in
picoseconds, which is too great for high-resolution ADC evaluation setups. Therefore, most evaluation
setups rely on the ADC internal clock buffer to convert a sinusoidal input signal into a ultralow-jitter square
wave. When selecting a sinusoidal clocking source, it has been shown that phase noise has a direct
impact on jitter performance. Consequently, great scrutiny should be applied to the phase-noise
performance of the clocking signal generator. TI has found that high-Q monolithic crystal filters can
improve the phase noise of the signal generator, and these filters become essential elements of the
evaluation setup when high ADC input frequencies are being evaluated.
14
SLAU206B – September 2007 – Revised April 2008