Lucent Technologies R5SI 用户手册
DEFINITY Enterprise Communications Server Release 5
Maintenance and Test for R5vs/si
Maintenance and Test for R5vs/si
555-230-123
Issue 1
April 1997
Maintenance Object Repair Procedures
Page 10-42
ADX16A-PT (AUDIX Analog Line/Control Link)
10
Note:
a. Retry the command at 1-minute intervals a maximum of 5 times.
Loop Around Test (#161)
This test is designed to check the on-board transmission capabilities of the NPE
on the analog port.
on the analog port.
Any
FAIL
The NPE of the tested port did not conference the tones correctly. This causes
noisy and unreliable connections.
noisy and unreliable connections.
1. Replace the circuit pack.
PASS
The port can correctly conference multiple connections. User-reported
troubles on this port should be investigated by using other port tests and by
examining station, trunk, or external wiring.
troubles on this port should be investigated by using other port tests and by
examining station, trunk, or external wiring.
Table 10-18.
TEST #161 Loop Around Test
Error
Code
Code
Test
Result
Description/ Recommendation
ABORT
Could not allocate the necessary system resources for this test. Try (a).
1000
ABORT
System resources required to run this test are not available. The port may be
busy with a valid call. Use the
busy with a valid call. Use the
display port PCSSpp
command to determine
the station extension. Use the
status station
command to determine the
service state of the port. If the port is in use, wait until it is idle before testing.
1. If the port status is idle, try (a).
1002
ABORT
The system could not allocate time slots for the test. The system may be under
heavy traffic conditions or it may have time slots out-of-service due to
TDM-BUS errors. Refer to “TDM-BUS” to diagnose TDM-BUS errors.
heavy traffic conditions or it may have time slots out-of-service due to
TDM-BUS errors. Refer to “TDM-BUS” to diagnose TDM-BUS errors.
1. If system has no TDM-BUS errors and is not handling heavy traffic, try (a).
Continued on next page
Table 10-17.
TEST #7 Conference Circuit Test —
Continued
Error
Code
Test
Result
Description/Recommendation
Continued on next page