National Instruments 321645c-01 用户手册

Contents

NI-DAQ FRM for PC Compatibles

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National Instruments Corporation

ND_INSIDE_REGION........................................................................... 2-85

ND_HIGH_HYSTERESIS ..................................................................... 2-86

ND_LOW_HYSTERESIS ...................................................................... 2-86

Pulse Generation Timing ........................................................................ 2-102

Pulse Timing for pulseWidth = 0............................................................ 2-103

Square Wave Timing .............................................................................. 2-112

Digital Scanning Input Group Handshaking Connections...................... 2-190

Digital Scanning Output Group Handshaking Connections ................... 2-191

Simple Event Counting ........................................................................... 2-217

Single Period Measurement .................................................................... 2-219

Single Pulse Width Measurement ........................................................... 2-221

Single Triggered Pulse Width Generation Measurement ....................... 2-224

Start-Stop Measurement.......................................................................... 2-226

Single Pulse Generation .......................................................................... 2-228

Single Triggered Pulse Generation ......................................................... 2-230

Retriggerable Pulse Generation .............................................................. 2-232

Pulse Train Generation ........................................................................... 2-233

Frequency Shift Keying .......................................................................... 2-235

Buffered Event Counting ........................................................................ 2-236

Buffered Period Measurement ................................................................ 2-238

Buffered Period Measurement when No Source Edges Are
Present between Gate Edges ................................................................... 2-239

Buffered Semi-Period Measurement when No Source Edges Are
Present between Gate Edges ................................................................... 2-239

Buffered Semi-Period Measurement when No Source Edges Are
Present between Gate Edges ................................................................... 2-240

Buffered Pulse Width Measurement ....................................................... 2-241

Buffered Pulse Width when Gate Is High during Arming...................... 2-241

Buffered Two-Signal Edge Separation Measurement ............................ 2-243

Mode 0 Timing Diagram ........................................................................ 2-252

Mode 1 Timing Diagram ........................................................................ 2-252

Mode 2 Timing Diagram ........................................................................ 2-252

Mode 3 Timing Diagram ........................................................................ 2-253

Mode 4 Timing Diagram ........................................................................ 2-253

Mode 5 Timing Diagram ........................................................................ 2-253

Tables

MIO and AI Devices ............................................................................... xvii

Status Values........................................................................................... 1-1

Primary Type Names .............................................................................. 1-2

The LabWindows/CVI Function Tree for Data Acquisition .................. 1-6