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HP 37717c 用户手册

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页码 共 12
8
Option
No of
Tick
code
slots
one
1.
PDH/DSn and ATM test and interfaces options
Choose one option (if required). All options provide PDH interfaces and
PDH test capability.
●
Unstructured  PDH testing: 0.7, 2, 8, 34 and 140 Mb/s interfaces plus an error output. ................. UKK
2
●
Structured PDH testing: 2, 8, 34 and 140 Mb/s interfaces (64 kb/s and n
×
64 kb/s testing). ......... UKJ
2
●
ATM cell generation and analysis: 2, 34 and 140 Mb/s interfaces† ...................................................... UKN
2
– includes all capability of option UKJ (structured PDH testing).
●
Structured DSn/PDH testing: DS1, DS3, E1 and E3 interfaces ............................................................... 110
2
(64 kb/s, 56 kb/s, n x 64 kb/s and n x 56 kb/s testing)
●
ATM cell generation and analysis: DS1, DS3, E1 and E3 interfaces ................................................... UKZ*
2
(equivalent to 1.5 Mb/s, 45 Mb/s, 2 Mb/s, 34 Mb/s)‡.
† If you need ATM cell generation and analysis at STM-1, then also order STM-0e/STM-1e
option A3R (section 2).
‡ If you need OC-3c, then also order STM-1e option A1T (section 2) and appropriate
optical interfaces and adaptor options (sections 7 and 12).
* Option UKZ does not support option A3R or 120 at present.
Please refer to module interworking section (pages 6 and 7).
Option
No of
Tick
code
slots
one
2.
SONET/SDH test and interfaces options
Choose one option (if required). These options provide SDH electrical interfacing
and SDH test capability.
●
SDH test module: STM-0e (52 Mb/s) and STM-1e (155 Mb/s) electrical interfaces, ........................ A3R*
2
STM-0/STM-1 overhead access,thru mode and pointer sequence generation, TU-12,
TU-2, VC-3 and VC-4 mappings plus frequency offset generation, alarm and error
generation/detection plus an error output, SDH alarm and BIP scan, tributary scan
and protection switch times.
●
SONET/SDH test module: STS-1/STM-0e (52 Mb/s) and STS-3/STM-1e (155 Mb/s) .......................... 120†
2
electrical interfaces, overhead access,thru mode and pointer sequence
generation, VT1.5/TU-11, VT2/TU-12, VT6/TU-2, STS-1/VC-3 SPE and STS-3c/VC-4 SPE
mappings plus frequency offset generation, alarm and error generation/detection
plus an error output, offset generation and BIP scan, tributary scan and protection switch times
plus frequency and BIP scan.
* Option A3R does not support option UKZ at present.
Please refer to module interworking section (pages 6 and 7).
† Option 120 does not support option UKZ and UHC at present.
Please refer to module interworking section (pages 6 and 7).
STM-1e (155 Mb/s) electrical interface: As per option A3R but without ..................................... A1T
2
STM-0e (52 Mb/s)capability, and without an error output.
Option
No of
Tick
code
slots
one
3.
Wander and jitter generation options
Choose on option (if required). For PDH jitter generation, also order PDH/DSn
option  (section 1). For SDH jitter generation, also order SONET/SDH option (section 2)
plus appropriate optical interfaces and adaptor options (sections 7 and 12).
●
PDH jitter generation: 2, 8, 34 and 140 Mb/s up to 80 UI (2 Mb/s). ....................................................... 140†
1
SDH jitter generation: STM-1 (155 Mb/s) and STM-4 (622 Mb/s) up to 200 UI (STM-4).
●
All the capability of option 140 plus wander generation: 2 Mb/s, STM-1 (155 Mb/s) ....................... A3K
1
and STM-4 (622 Mb/s) up to 14400 UI (STM-4).
† 8 and 140 Mb/s jitter generation requires a PDH option with 8 and 140 Mb/s
interface to be fitted