National Instruments 3.21E+04 用户手册

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Appendix A     Specifications for AT-MIO-16XE-10 and AT-AI-16XE-10
 National Instruments Corporation
A-23
AT-MIO/AI E Series User Manual
Dynamic Characteristics
Settling time for full-scale step.......... 10 
µ
s to 
±
1 LSB accuracy
Slew rate ........................................... 5 V/
µ
s
Noise ................................................. 60 
µ
Vrms, DC to 1 MHz
Stability
Offset temperature coefficient ...........
±
50 
µ
V/
°
C
Gain temperature coefficient .............
±
7.5 ppm/
°
C
Onboard calibration reference
Level........................................... 5.000 V (
±
0.5 mV) (actual value 
stored in EEPROM)
Temperature coefficient ..............
±
0.6 ppm/
°
C max
Long-term stability .....................
±
6 ppm/
Digital I/O
Number of channels .......................... 8 input/output
Compatibility .................................... TTL/CMOS
Power-on state................................... Input (High-Z)
Data transfers .................................... Programmed I/O
Digital logic levels ............
Level
Min
Max
Input low voltage
0 V
0.8 V
Input high voltage
2 V
5 V
Input low current 
-320 
µ
A
Input high current
10 
µ
A
Output low 
voltage
(IOL = 24 mA)
0.4 V
Output high 
voltage
(IOH = 13 mA)
4.35 V
1, 000 h