Micron 128GB RealSSD C400 SED MTFDDAA128MAM-1J12 数据表

Electrical Characteristics

Stresses greater than those listed may cause permanent damage to the device. This is a
stress rating only, and functional operation of the device at these or any other condi-
tions above those indicated in the operational sections of this specification is not im-
plied. Exposure to absolute maximum rating conditions for extended periods may affect
reliability.

Table 9: SATA Power Consumption

Density

Idle Average

Active Average

Sequential Write/Read Maximum

(128k transfer)

Unit

128GB

<85

150

3500

2000

mW

256GB

<85

160

4000

2200

mW

512GB

<100

280

5500

2500

mW

Notes: 1. Data taken at 25°C using a 6 Gb/s SATA interface.

2. Active average power measured while running MobileMark

®

 2007 Productivity Suite.

3. DIPM (device-initiated power management) enabled.
4. Sequential power measured in IOMETER MAX with 128KB transfer size.

Table 10: Maximum Ratings

Parameter/Condition

Symbol

Min

Max

Unit

Voltage input

V33

3.14

3.46

V

Operating temperature

T

C

0

70

°C

Non-operating temperature

 

–40

85

°C

Rate of temperature change

 

–

20

°C/hour

Relative humidity (non-condensing)

 

5

95

%

Note: 1. Temperature is best measured with a thermocouple attached to the center point of the

exterior of the case on the cast side where the SATA connector is not visible). Contact
with the drive label is acceptable.

Table 11: Shock and Vibration

Parameter/Condition

Specification

Operating shock

1500 G/1.0ms

Operating vibration

2–500Hz at 3.1G

Preliminary

C400 1.8-Inch NAND Flash Self-Encrypting Drive SSD

Electrical Characteristics

PDF: 09005aef84884439
realssd_c400_2_5_sed.pdf - Rev. A 09/11 EN

9

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