Freescale Semiconductor DEMO9S08DZ60 Demo Board DEMO9S08DZ60 DEMO9S08DZ60 数据表

376

Freescale Semiconductor

6

C

RTC adder to stop2 or stop3

5

, 25

°

C

5

300

—

nA

3

300

—

nA

7

C

LVD adder to stop3 (LVDE = LVDSE = 1)

5

110

—

μ

A

3

90

—

μ

A

8

C

Adder to stop3 for oscillator enabled

6

(IRCLKEN = 1 and IREFSTEN = 1 or
ERCLKEN = 1 and EREFSTEN = 1)

5

5

—

μ

A

3

5

—

μ

A

1

Typicals are measured at 25

°

C, unless otherwise noted.

2

Maximum values in this column apply for the full operating temperature range of the device unless otherwise noted.

3

All modules except ADC active, MCG configured for FBE, and does not include any dc loads on port pins

4

Stop currents are tested in production for 25

°

C on all parts. Tests at other temperatures depend upon the part number

suffix and maturity of the product. Freescale may eliminate a test insertion at a particular temperature from the
production test flow once sufficient data has been collected and is approved.

5

Most customers are expected to find that auto-wakeup from stop2 or stop3 can be used instead of the higher current
wait mode.

6

Values given under the following conditions: low range operation (RANGE = 0), low power mode (HGO = 0).

1

—

Supply voltage

V

DD

2.7

—

5.5

V

2

D

Supply current (active)

I

DDAC

—

20

35

μ

A

3

D

Analog input voltage

V

AIN

V

SS

 – 0.3

—

V

DD

V

4

D

Analog input offset voltage

V

AIO

20

40

mV

5

D

Analog Comparator hysteresis

V

H

3.0

6.0

20.0

mV

6

D

Analog input leakage current

I

ALKG

--

--

1.0

μ

A

7

D

Analog Comparator initialization delay

t

AINIT

—

—

1.0

μ

s

Supply voltage

Absolute

V

DDAD

2.7

—

5.5

V

Delta to V

DD

 (V

DD

-V

DDAD

)

2

Δ

V

DDAD

-100

0

+100

mV

Ground voltage

Delta to V

SS

 (V

SS

-V

SSAD

Δ

V

SSAD

-100

0

+100

mV