Hitachi Microscope & Magnifier S-3400N 用户手册

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3.4    Adjusting the Electron Optical System 
3 - 22 
3.4.2  Axial Alignment 
 
To fully exploit the capabilities of the system, it is necessary to perform axis alignment on the 
electron optical system.   
The chart below shows axis alignment procedures. The required items should be adjusted after 
imaging conditions are modified. 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
(A) Basic axis alignment while viewing an image 
(B) Using the Auto feature 
 
Fig. 3.4-4    Axis Alignment Procedures 
 
Method (A), shown on the left side of Figure 3.4-4, is a basic axis alignment method that allows 
you to perform alignments by moving a knob on the Control Panel while viewing an image. In the 
electromagnetic alignment part (Beam Alignment horizontal, tilt alignment, Aperture 
Alignment adjustment, Stigma Alignment, and X, Y alignment) can also be aligned by using 
Method (B), which combines the Auto features. 
 
 
3.4.2.1    Items Requiring Axial Alignment 
 
The list below shows when an axial alignment is needed and what specific items need to be 
adjusted. For further details, see <3.4.2.2 Axial Alignment Items in Detail>. 
 
(1)  After a filament is replaced: Adjust all items. 
(2)  After the position of the objective movable aperture has been changed: 
 
 
Adjust items (3)-(5). 
(3)  When the accelerating voltage or probe current is changed: 
 
 
Adjust items (4) and (5). 
(4)  Adjustment of Auto Focus is not suitable well : 
 
 
Adjust item (6). 
AAA 
(Auto Axial Alignment) 
ABA 
(Auto Beam Alignment) 
(2)  Beam Alignment: horizontal, tilt alignments (electromagnetic 
alignment) 
(3)  Mechanical alignment of objective lens movable aperture 
(4)  Aperture Alignment (electromagnetic alignment) 
(5)  Stigma Alignment X, Y (electromagnetic alignment) 
(6) AFC Alignment  
(1)  Preliminary to axial alignment