Hitachi Microscope & Magnifier S-3400N 用户手册

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6.4    CD Measurement Function (Option) 
6 - 86 
6.4.5.5  Calibration 
 
The accuracy of measured values depends on the accuracy of image magnification unless 
calibration has been made.    Factors that affect the accuracy include accelerating voltage, scan 
speed, magnification setting, working distance, raster rotation angle and others.    By fixing these 
parameters and conducting calibration with a sample of known dimensions, measurement can 
be made with an even higher accuracy. 
 
(1) 
Using Registered Calibration factor 
 
Calibration is specified by means of the Calibration selector box on CD Measurement window.   
The modes of calibration are selectable from the following. 
 
(a)  Auto Select 
Automatically selects calibration that matches the measurement parameters.    When a 
number of calibrations have been registered under the same parameters, the 
calibration registered at the maximum Entry No. among the relevant parameters will 
be selected. 
 
(b)  Entry No. 
Calibration is applied only when the SEM parameters of the specified calibration match 
the SEM parameters of the object image.    Specifying an Entry No. displays the 
corresponding SEM parameters.    An Entry No. for which calibration is not registered 
cannot be specified. 
 
(c)  Not Apply 
Calibration is not applied. 
 
(2) 
Applied Parameters for Calibration 
 
Calibration is made when the present SEM parameters are within the following ranges as 
compared with the calibrated condition. 
 
•  Accelerating voltage 
Same as calibrated condition 
•  Viewing magnification 
±1% of calibrated mag.   
•  Working distance 
±0.5mm of calibration working distance 
•  Detector 
Same as calibrated condition   
•  Probe Current 
±1.0 of calibrated condition   
•  Vacuum 
Same as calibrated condition 
•  Scan speed 
Same as calibrated condition