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GOSSEN METRAWATT GMBH
19
9.3
Measuring Leakage Current
Attention!
!
During leakage current measurement it is essential to ensure 
that the DUT is operated at mains voltage. Exposed conductive 
parts may be subject to hazardous contact voltage during the 
test and may not be touched under any cricumstances. (A 
mains shutdown takes place when the leakage current exceeds 
approx. 10 mA).
Select the 
I
xx
 
measurement and start.
Each time line voltage is 
applied to the test socket, 
L and N are reversed, if 
this function has been se-
lected in the leakage cur-
rent menu (see chapter 
9.3 on page 19).
Frequency response is 
taken into consideration in 
accordance with the dia-
gram to the right when 
leakage current is
measured.
9.3.1
Contact Current I
Contact
 (probe current, housing leakage current)
Current which flows from housing 
parts which are not connected to 
the protective conductor via an 
external conductive connection 
to earth or another part of the 
housing. Flow of current via the 
protective conductor is excluded 
in this case.
The current’s AC component is 
measured. The DC component can also be measured by means of indi-
vidual measurement (but not with a test sequence).
9.3.2
Residual Current 
ΔI
Sum of instantaneous current values which flow via the L and N conduc-
tors at the device mains connection (also known as differential current). 
Residual current is practically identical to fault current in the event of an 
error. Fault current: Current which is caused by an insulation defect, and 
which flows via the defective point.
Attention: Residual current also includes contact current.
9.3.3
Device Leakage Current I
DL
 per DIN VDE 0751
Device leakage current is determined by means of differential current 
measurement.
Maximum Allowable Limit Values for Leakage Current in mA 
* for devices with a heating power > 3.5 kW
Note 1: 
Devices which do not have any exposed conductive parts which are
connected to the protective conductor, and which correspond with
I
DL
 and, if applicable, I
PL
, e.g. data processing equipment with 
shielded power pack
Note 2:
Permanently connected devices with protective conductor
Note 3:
Portable x-ray devices with mineral insulation
Key
I
Contact
Housing leakage current (probe or contact current)
ΔI
Residual current
I
DL
Device leakage current
10
10
2
10
3
10
4
10
5
10
6
+20
0
–20
–40
–60
Frequency (f) in Hz
Relative Magnitude (dB): 
20 log
U(
f)
U(
f=10)
μΑ
2
L
N
1
1 Test socket (w/o protective conductor contact)
2 Device  housing
Test 
Standard
I
PE
I
Contact
ΔI
I
DL
NC
SFC
NC
SFC
VDE 0701
-1: 2000
SC I: 3.5
1 mA/kW *
0.5
SCI: 3.5
1 mA/kW *
SC II: 0.5
VDE 0701
-240
0.25
VDE 0702:
2004
SC I: 3.5
1 mA/kW *
0.5
3.5
VDE 0751:
2001
General 0.5
Notes 1 & 3 2.5
Note 2 5.0
SC II 0.1