GE IMP2B 数据表

GE

Intelligent Platforms

Features
•  High Coverage Initialization Test for  

PowerPC SBC

•  Functionally Verifiable Coverage Figures
•  Field Diagnostic Capability
•  Background Tests to co-exist with COTS  

Operating System

•  Non-Volatile Storage of Results and Test

Configurations

With the increasing use of COTS (commercial  
off-the-shelf) boards based on mainstream
silicon for mission-critical applications,
and the increasing use of COTS operating
systems on these boards, new challenges
are being presented in the critical arena of
Deployed Test.

Such challenges include: a decreasing 
quality of failure rate data from chip vendors 
who focus on standard commercial markets;
a necessity for test functions to not intrude
upon the operating system (OS) or higher
level software components obtained from
the open market; an increasing need to
supply test softwares that can easily 
be adapted to the evolving architectures 
promoted by technology insertion and 
COTS interoperability.

Deployed Test Solutions

Leading the evolution of these trends,
GE Intelligent Platform has addressed
the challeng es and has the products
and the methodologies that can deliver
appropriate deployed test routines for this
environment, while maintaining the full
benefits of COTS usage.

GE Intelligent Platform’s Deployed Test 
philosophy is supported by two products
for maximum confidence in all scenarios.
Our BIT (built-in test) product provides a
high confidence initialization test with
visual and OS-reported results for Line
Replacement Unit (LRU) failure.

Our BCS (Background Condition Screening)
provides continuous health monitoring
that is co-operative with, and not intrusive
upon, standard COTS operating systems.