Atmel Evaluation Kit AT91SAM9X35-EK AT91SAM9X35-EK Data Sheet

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SAM9X35 [DATASHEET]

11055E–ATARM–10-Mar-2014

 shows a test environment example. Test vectors are sent and interpreted by the tester. In this example, the

“board in test” is designed using a number of JTAG-compliant devices. These devices can be connected to form a single
scan chain. 

JTAG 

Interface

ICE/JTAG 

Connector

SAM9-based Application Board In Test

SAM9

Test Adaptor

Chip 2

Chip n

Chip 1

Tester