Atmel ARM-Based Evaluation Kit AT91SAM9N12-EK AT91SAM9N12-EK Data Sheet
Product codes
AT91SAM9N12-EK
49
SAM9N12/SAM9CN11/SAM9CN12 [DATASHEET]
11063K–ATARM–05-Nov-13
10.
Debug and Test
10.1
Description
The SAM9CN12 features a number of complementary debug and test capabilities. A common JTAG/ICE (In-Circuit
Emulator) port is used for standard debugging functions, such as downloading code and single-stepping through
programs. The Debug Unit provides a two-pin UART that can be used to upload an application into internal SRAM. It
manages the interrupt handling of the internal COMMTX and COMMRX signals that trace the activity of the Debug
Communication Channel.
Emulator) port is used for standard debugging functions, such as downloading code and single-stepping through
programs. The Debug Unit provides a two-pin UART that can be used to upload an application into internal SRAM. It
manages the interrupt handling of the internal COMMTX and COMMRX signals that trace the activity of the Debug
Communication Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from a PC-based test
environment.
environment.
10.2
Embedded Characteristics
Debug capabilities can be forbidden with a fuse bit.
ARM926 Real-time In-circuit Emulator
Two real-time Watchpoint Units
Two Independent Registers: Debug Control Register and Debug Status Register
Test Access Port Accessible through JTAG Protocol
Debug Communications Channel
Debug Unit
Two-pin UART
Debug Communication Channel Interrupt Handling
Chip ID Register
IEEE1149.1 JTAG Boundary-scan on All Digital Pins.