Atmel ARM-Based Evaluation Kit AT91SAM9N12-EK AT91SAM9N12-EK Data Sheet
Product codes
AT91SAM9N12-EK
54
SAM9N12/SAM9CN11/SAM9CN12 [DATASHEET]
11063K–ATARM–05-Nov-13
10.6.4 IEEE 1149.1 JTAG Boundary Scan
IEEE 1149.1 JTAG Boundary Scan allows pin-level access independent of the device packaging technology.
IEEE 1149.1 JTAG Boundary Scan is enabled when JTAGSEL is high. The SAMPLE, EXTEST and BYPASS functions
are implemented. In ICE debug mode, the ARM processor responds with a non-JTAG chip ID that identifies the
processor to the ICE system. This is not IEEE 1149.1 JTAG-compliant.
are implemented. In ICE debug mode, the ARM processor responds with a non-JTAG chip ID that identifies the
processor to the ICE system. This is not IEEE 1149.1 JTAG-compliant.
It is not possible to switch directly between JTAG and ICE operations. A chip reset must be performed after JTAGSEL is
changed.
changed.
A Boundary-scan Descriptor Language (BSDL) file is provided to set up test.
10.6.5 JTAG ID Code Register
Access: Read-only
• VERSION[31:28]: Product Version Number
Set to 0x0.
• PART NUMBER[27:12]: Product Part Number
Product part Number is 0x05B3
• MANUFACTURER IDENTITY[11:1]
Set to 0x01F.
Bit[0] required by IEEE Std. 1149.1.
Set to 0x1.
JTAG ID Code value is 0x05B3_003F.
31
30
29
28
27
26
25
24
VERSION
PART NUMBER
23
22
21
20
19
18
17
16
PART NUMBER
15
14
13
12
11
10
9
8
PART NUMBER
MANUFACTURER IDENTITY
7
6
5
4
3
2
1
0
MANUFACTURER IDENTITY
1